Latency Variation Aware Read Performance Optimization on 3D High Density NAND Flash Memory

Yina Lv, Liang Shi*, Chun Jason Xue, Qingfeng Zhuge, Edwin H.-M. Sha

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

15 Citations (Scopus)

Abstract

State-of-the-art high density NAND flash memory has been recommended as read intensive storage device due to their excellent read performance. However, recent studies and reports show that the read latency of high density NAND flash memory is increasing. The reason comes from at least two aspects: First, high density flash generally adopts multiple bits per cell technique, where the access latency of the most significant bits is largely increased. Second, due to the reliability variation among these bits, the access latency of the most significant bits is further increased. We introduce RLV, a read performance optimization scheme is proposed to exploit the read latency variation among the multiple bits. The basic idea is that firstly identify the hotness of read data and then move them to the places with corresponding read latency. Our evaluation shows that RLV incurs negligible overhead, while improving read performance by 14% on average compared with state-of-the-arts.
Original languageEnglish
Title of host publicationGLSVLSI'20 Proceedings of the 2020 Great Lakes Symposium on VLSI
PublisherAssociation for Computing Machinery
Pages411-414
ISBN (Electronic)9781450379441
DOIs
Publication statusPublished - Sept 2020
EventThe 30th edition of the ACM Great Lakes Symposium on VLSI (GLSVLSI 2020) : “In-Memory Processing for Future Electronics” - Virtual, Online, Beijing, China
Duration: 8 Sept 202011 Sept 2020
Conference number: 30
https://www.glsvlsi.org/index.html

Publication series

NameProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Conference

ConferenceThe 30th edition of the ACM Great Lakes Symposium on VLSI (GLSVLSI 2020)
PlaceChina
CityBeijing
Period8/09/2011/09/20
Internet address

Research Keywords

  • 3D Stacking NAND
  • Read latency
  • Reliability

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