iTRIM : I/O-Aware TRIM for Improving User Experience on Mobile Devices

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Chenchen Fu
  • Rachata Ausavarungnirun
  • Riwei Pan
  • Siyu Chen
  • Liang Shi

Related Research Unit(s)

Detail(s)

Original languageEnglish
Number of pages16
Journal / PublicationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Online published29 Sep 2020
Publication statusOnline published - 29 Sep 2020

Abstract

TRIM is a recommended command to deliver data invalidation information of the file system to flash storage. It is issued on both system level and device level. Since it can reduce the number of data copies during device-level garbage collection (DGC), TRIM has been widely used to improve the endurance and performance of mobile devices. Contrary to the common belief, this work identifies that the default TRIM scheme has both merit and drawback to the performance of mobile devices, especially in Flash-friendly file system (F2FS), which is a commonly-used file system in mobile devices. On one hand, TRIM can reduce GC migration to prolong the flash lifetime as well as improving I/O throughput; On the other hand, TRIM may induce I/O contentions. This paper proposes a new TRIM scheme, iTRIM, to distribute the timing overheads to system idle time. To further reduce I/O contention and improve I/O performance, the design of iTRIM considers the TRIM size and the logical addresses’ pattern of victim invalidated data. Experimental results show that iTRIM can minimize I/O contentions while retaining the benefits of the default TRIM scheme for endurance and performance.

Research Area(s)

  • Computer science, Data structures, Delays, Discard, F2FS, File systems, Mobile device, Mobile handsets, Performance evaluation, Portable document format, TRIM, User experience

Citation Format(s)

iTRIM : I/O-Aware TRIM for Improving User Experience on Mobile Devices. / Liang, Yu; Ji, Cheng; Fu, Chenchen; Ausavarungnirun, Rachata; Li, Qiao; Pan, Riwei; Chen, Siyu; Shi, Liang; Kuo, Tei-Wei; Xue, Chun Jason.

In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 29.09.2020.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review