TY - JOUR
T1 - Irradiation induced void spheroidization, shrinkage and migration in Cu at elevated temperatures
T2 - An in situ study
AU - Fan, Cuncai
AU - Annadanam, Rayaprolu Goutham Sreekar
AU - Shang, Zhongxia
AU - Li, Jin
AU - Li, Meimei
AU - Wang, Haiyan
AU - El-Azab, Anter
AU - Zhang, Xinghang
PY - 2020/12
Y1 - 2020/12
N2 - Understanding the void evolution in irradiation environment is of great interest and significance, as irradiation-induced voids typically lead to pronounced volumetric swelling and degradation of mechanical properties. In situ studies on the irradiation response of nanovoids at elevated temperature remain limited. In this work, we performed systematic in situ 1 MeV Kr++ irradiations on Cu with nanovoids in a transmission electron microscope up to 350 °C. The in situ studies revealed intriguing void spheroidization, shrinkage and migration. Furthermore, the morphology evolution and migration of nanovoids showed a strong dependence on irradiation temperature and initial void size. Post-irradiation analyses identified defect clusters in the form of stacking fault tetrahedrons, and the remaining large faceted nanovoids. The underlying mechanisms of irradiation-induced void spheroidization and shrinkage were discussed based on phase-field modeling.
AB - Understanding the void evolution in irradiation environment is of great interest and significance, as irradiation-induced voids typically lead to pronounced volumetric swelling and degradation of mechanical properties. In situ studies on the irradiation response of nanovoids at elevated temperature remain limited. In this work, we performed systematic in situ 1 MeV Kr++ irradiations on Cu with nanovoids in a transmission electron microscope up to 350 °C. The in situ studies revealed intriguing void spheroidization, shrinkage and migration. Furthermore, the morphology evolution and migration of nanovoids showed a strong dependence on irradiation temperature and initial void size. Post-irradiation analyses identified defect clusters in the form of stacking fault tetrahedrons, and the remaining large faceted nanovoids. The underlying mechanisms of irradiation-induced void spheroidization and shrinkage were discussed based on phase-field modeling.
KW - In situ irradiation
KW - Phase-field modeling
KW - Spheroidization
KW - Stacking fault tetrahedron
KW - Void migration
UR - http://www.scopus.com/inward/record.url?scp=85094314232&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85094314232&origin=recordpage
U2 - 10.1016/j.actamat.2020.10.008
DO - 10.1016/j.actamat.2020.10.008
M3 - RGC 21 - Publication in refereed journal
SN - 1359-6454
VL - 201
SP - 504
EP - 516
JO - Acta Materialia
JF - Acta Materialia
ER -