Ion Migration in Perovskite Light-Emitting Diodes : Mechanism, Characterizations, and Material and Device Engineering
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 2108102 |
Journal / Publication | Advanced Materials |
Volume | 34 |
Issue number | 19 |
Online published | 30 Nov 2021 |
Publication status | Published - 12 May 2022 |
Externally published | Yes |
Link(s)
Abstract
In recent years, perovskite light-emitting diodes (PeLEDs) have emerged as a promising new lighting technology with high external quantum efficiency, color purity, and wavelength tunability, as well as, low-temperature processability. However, the operational stability of PeLEDs is still insufficient for their commercialization. The generation and migration of ionic species in metal halide perovskites has been widely acknowledged as the primary factor causing the performance degradation of PeLEDs. Herein, this topic is systematically discussed by considering the fundamental and engineering aspects of ion-related issues in PeLEDs, including the material and processing origins of ion generation, the mechanisms driving ion migration, characterization approaches for probing ion distributions, the effects of ion migration on device performance and stability, and strategies for ion management in PeLEDs. Finally, perspectives on remaining challenges and future opportunities are highlighted. © 2022 Wiley-VCH GmbH.
Research Area(s)
- device engineering, device stability, ion migration, perovskite light-emitting diodes
Citation Format(s)
Ion Migration in Perovskite Light-Emitting Diodes: Mechanism, Characterizations, and Material and Device Engineering. / Li, Nan; Jia, Yongheng; Guo, Yuwei et al.
In: Advanced Materials, Vol. 34, No. 19, 2108102, 12.05.2022.
In: Advanced Materials, Vol. 34, No. 19, 2108102, 12.05.2022.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review