Investigation of synchrotron X-ray induced oxidation of Ag–Cu thin-film

Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

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Author(s)

  • Jian Hui
  • Hengrui Zhang
  • Qingyun Hu
  • Zhan Zhang
  • Lanting Zhang
  • Hong Wang

Detail(s)

Original languageEnglish
Article number127843
Journal / PublicationMaterials Letters
Volume272
Online published18 Apr 2020
Publication statusPublished - 1 Aug 2020
Externally publishedYes

Link(s)

DOI

DOI
Check@CityULib
Link to Scopus https://www.scopus.com/record/display.uri?eid=2-s2.0-85083549703&origin=recordpage
Permanent Link https://scholars.cityu.edu.hk/en/publications/publication(92bb7439-4bb8-4a1f-916c-5ab4c2e4de64).html

Abstract

Combinatorial Ag–Cu thin-films were irradiated by synchrotron X-ray in air to investigate the beam damage on the surface of the thin-film. The main effect was found to be oxidation with the oxidation state primarily depending on film composition: CuO formed on the pure Cu film, whereas Cu2O formed in the presence of Ag. Meanwhile, formation of crystalline Ag2O2 was favored and preferentially in the Ag-rich area. These results are of great importance in studying the oxidation of noble metal nano-film, and in the characterization of nano-films using synchrotron X-ray.

Research Area(s)

  • Irradiated, Oxidation., Synchrotron X-ray, Thin-film

Citation Format(s)

[ RIS ] [ BibTeX ]

Investigation of synchrotron X-ray induced oxidation of Ag–Cu thin-film. / Hui, Jian; Zhang, Hengrui; Hu, Qingyun et al.

In: Materials Letters, Vol. 272, 127843, 01.08.2020.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review