Abstract
Planar waveguide was fabricated in Er:Yb:phosphate glass by a single energy implantation of 2.5 MeV He+ at a dose of 1.6 × 1016 ions/cm2. The waveguide was characterized by prism coupling method, and the refractive index profile was reconstructed using the inverse Wentzel-Kramers-Brillouin method. The photoluminescence was also measured. The energy loss was simulated, and the results were compared and discussed with respect to the refractive index profile in the waveguide.
| Original language | English |
|---|---|
| Pages (from-to) | 1135-1137 |
| Journal | Journal of Materials Research |
| Volume | 16 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - Apr 2001 |
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