Intrinsic and N-Related Defects in Hydrogen-Free ZnO Films Fabricated by Plasma Immersion Ion Implantation

Y. F. Mei, Ricky K. Y. Fu, G. G. Siu, Paul K. Chu, C. L. Yang, W. K. Ge

    Research output: Conference PapersRGC 32 - Refereed conference paper (without host publication)peer-review

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