Interfacial structure in silicon nitride sintered with lanthanide oxide

C. Dwyer; A. Ziegler; N. Shibata; G. B. Winkelman; R. L. Satet; M. J. Hoffmann; M. K. Cinibulk; P. F. Becher; G. S. Painter; N. D. Browning; D. J. H. Cockayne; R. O. Ritchie; S. J. Pennycook

doi:10.1007/s10853-006-0152-2

Interfacial structure in silicon nitride sintered with lanthanide oxide

C. Dwyer^*, A. Ziegler, N. Shibata, G. B. Winkelman, R. L. Satet, M. J. Hoffmann, M. K. Cinibulk, P. F. Becher, G. S. Painter, N. D. Browning, D. J. H. Cockayne, R. O. Ritchie, S. J. Pennycook

^*Corresponding author for this work

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

22 Citations (Scopus)

Abstract

Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln₂O₃. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.

Original language	English
Pages (from-to)	4405-4412
Journal	Journal of Materials Science
Volume	41
Issue number	14
Online published	14 May 2006
DOIs	https://doi.org/10.1007/s10853-006-0152-2
Publication status	Published - Jul 2006
Externally published	Yes

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Dwyer, C., Ziegler, A., Shibata, N., Winkelman, G. B., Satet, R. L., Hoffmann, M. J., Cinibulk, M. K., Becher, P. F., Painter, G. S., Browning, N. D., Cockayne, D. J. H., Ritchie, R. O., & Pennycook, S. J. (2006). Interfacial structure in silicon nitride sintered with lanthanide oxide. Journal of Materials Science, 41(14), 4405-4412. https://doi.org/10.1007/s10853-006-0152-2

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title = "Interfacial structure in silicon nitride sintered with lanthanide oxide",

abstract = "Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.",

author = "C. Dwyer and A. Ziegler and N. Shibata and Winkelman, {G. B.} and Satet, {R. L.} and Hoffmann, {M. J.} and Cinibulk, {M. K.} and Becher, {P. F.} and Painter, {G. S.} and Browning, {N. D.} and Cockayne, {D. J. H.} and Ritchie, {R. O.} and Pennycook, {S. J.}",

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doi = "10.1007/s10853-006-0152-2",

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T1 - Interfacial structure in silicon nitride sintered with lanthanide oxide

AU - Dwyer, C.

AU - Ziegler, A.

AU - Shibata, N.

AU - Winkelman, G. B.

AU - Satet, R. L.

AU - Hoffmann, M. J.

AU - Cinibulk, M. K.

AU - Becher, P. F.

AU - Painter, G. S.

AU - Browning, N. D.

AU - Cockayne, D. J. H.

AU - Ritchie, R. O.

AU - Pennycook, S. J.

PY - 2006/7

Y1 - 2006/7

N2 - Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.

AB - Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope images which clearly reveal the presence of well-defined Ln segregation sites at the interfaces, and, moreover, reveal that these segregation sites are element-specific. While some results differ across the three research groups, the vast majority exhibits good reproducibility.

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DO - 10.1007/s10853-006-0152-2

M3 - RGC 21 - Publication in refereed journal

SN - 0022-2461

VL - 41

SP - 4405

EP - 4412

JO - Journal of Materials Science

JF - Journal of Materials Science

IS - 14

ER -

Interfacial structure in silicon nitride sintered with lanthanide oxide

Abstract

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