Abstract
The origins of recently reported visible-light photoelectrochemical activity in ZnS–GaP (ZG) multilayer films are investigated using aberration-corrected scanning transmission electron microscopy (STEM). It is revealed that the multilayers carry a large volume fraction of defects, specifically stacking faults and twins, at the interfaces. The defects act as excellent channels for diffusion. For each ZG interface, a ∼5 nm-interdiffused region with an effective chemical composition of a ZnS–GaP solid solution is observed. Previous theoretical calculations have found that ZnS–GaP solid solutions possess a lower band gap than either GaP or ZnS and thus are expected to have better visible-light photo-activity. These findings are thus able to explain the observed commensurate increase in the visible-light photoelectrochemical response with increasing number of ZG layers. This work suggests that interfaces with intentionally designed lattice imperfections and/or intentionally driven interdiffusion leading to local solid solution formation provide a new materials design strategy for achieving efficient visible-light photo-activity.
| Original language | English |
|---|---|
| Pages (from-to) | 139-147 |
| Journal | Acta Materialia |
| Volume | 181 |
| Online published | 24 Sept 2019 |
| DOIs | |
| Publication status | Published - Dec 2019 |
| Externally published | Yes |
Research Keywords
- Compound semiconductor interface
- Photoelectrochemical activity
- Thin film
- ZnS–GaP multilayers
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