Interfacial electronic structure of copper hexadecafluorophthalocyanine and phthalocyanatotin (IV) dichloride studied by photoemission spectroscopy

Haibo Wang; Zengtao Liu; Tsz Wai Ng; Ming Fai Lo; Chun-Sing Lee; Donghang Yan; Shuit-Tong Lee

doi:10.1063/1.3406214

Interfacial electronic structure of copper hexadecafluorophthalocyanine and phthalocyanatotin (IV) dichloride studied by photoemission spectroscopy

Haibo Wang, Zengtao Liu, Tsz Wai Ng, Ming Fai Lo, Chun-Sing Lee, Donghang Yan, Shuit-Tong Lee

Centre of Super-Diamond and Advanced Films

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

10 Citations (Scopus)

Abstract

We investigated the interfacial electronic structure of the n-n isotype organic heterojunction formed between copper hexadecafluorophthalocyanine (F₁₆CuPc) and phthalocyanatotin (IV) dichloride (SnCl₂ Pc) using ultraviolet and x-ray photoemission spectroscopies. Energy level bending was observed at the heterojunction interface due to the formation of an electron accumulation region in the F₁₆CuPc layer and an electron depletion region in the SnC_l2Pc layer. The formation of organic heterojunction was explained by charge exchange at the interface due to their different work functions. © 2010 American Institute of Physics.

Original language	English
Article number	173303
Journal	Applied Physics Letters
Volume	96
Issue number	17
DOIs	https://doi.org/10.1063/1.3406214
Publication status	Published - 26 Apr 2010

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title = "Interfacial electronic structure of copper hexadecafluorophthalocyanine and phthalocyanatotin (IV) dichloride studied by photoemission spectroscopy",

abstract = "We investigated the interfacial electronic structure of the n-n isotype organic heterojunction formed between copper hexadecafluorophthalocyanine (F16CuPc) and phthalocyanatotin (IV) dichloride (SnCl2 Pc) using ultraviolet and x-ray photoemission spectroscopies. Energy level bending was observed at the heterojunction interface due to the formation of an electron accumulation region in the F16CuPc layer and an electron depletion region in the SnCl2Pc layer. The formation of organic heterojunction was explained by charge exchange at the interface due to their different work functions. {\textcopyright} 2010 American Institute of Physics.",

author = "Haibo Wang and Zengtao Liu and Ng, {Tsz Wai} and Lo, {Ming Fai} and Chun-Sing Lee and Donghang Yan and Shuit-Tong Lee",

year = "2010",

month = apr,

day = "26",

doi = "10.1063/1.3406214",

language = "English",

volume = "96",

journal = "Applied Physics Letters",

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publisher = "American Institute of Physics",

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}

Interfacial electronic structure of copper hexadecafluorophthalocyanine and phthalocyanatotin (IV) dichloride studied by photoemission spectroscopy. / Wang, Haibo; Liu, Zengtao; Ng, Tsz Wai et al.
In: Applied Physics Letters, Vol. 96, No. 17, 173303, 26.04.2010.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

TY - JOUR

T1 - Interfacial electronic structure of copper hexadecafluorophthalocyanine and phthalocyanatotin (IV) dichloride studied by photoemission spectroscopy

AU - Wang, Haibo

AU - Liu, Zengtao

AU - Ng, Tsz Wai

AU - Lo, Ming Fai

AU - Lee, Chun-Sing

AU - Yan, Donghang

AU - Lee, Shuit-Tong

PY - 2010/4/26

Y1 - 2010/4/26

N2 - We investigated the interfacial electronic structure of the n-n isotype organic heterojunction formed between copper hexadecafluorophthalocyanine (F16CuPc) and phthalocyanatotin (IV) dichloride (SnCl2 Pc) using ultraviolet and x-ray photoemission spectroscopies. Energy level bending was observed at the heterojunction interface due to the formation of an electron accumulation region in the F16CuPc layer and an electron depletion region in the SnCl2Pc layer. The formation of organic heterojunction was explained by charge exchange at the interface due to their different work functions. © 2010 American Institute of Physics.

AB - We investigated the interfacial electronic structure of the n-n isotype organic heterojunction formed between copper hexadecafluorophthalocyanine (F16CuPc) and phthalocyanatotin (IV) dichloride (SnCl2 Pc) using ultraviolet and x-ray photoemission spectroscopies. Energy level bending was observed at the heterojunction interface due to the formation of an electron accumulation region in the F16CuPc layer and an electron depletion region in the SnCl2Pc layer. The formation of organic heterojunction was explained by charge exchange at the interface due to their different work functions. © 2010 American Institute of Physics.

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U2 - 10.1063/1.3406214

DO - 10.1063/1.3406214

M3 - RGC 21 - Publication in refereed journal

SN - 0003-6951

VL - 96

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 17

M1 - 173303

ER -

Interfacial electronic structure of copper hexadecafluorophthalocyanine and phthalocyanatotin (IV) dichloride studied by photoemission spectroscopy

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