Interdiffusion in copper-aluminum thin film bilayers. II. Analysis of marker motion during sequential compound formation

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

21 Scopus Citations
View graph of relations



Original languageEnglish
Pages (from-to)6929-6937
Journal / PublicationJournal of Applied Physics
Issue number12
Publication statusPublished - 1983
Externally publishedYes


Isolated W islands, 150 Å in diameter, have been deposited between Cu and Al thin film bilayers to serve as inert diffusion markers. Marker displacements have been measured consecutively by Rutherford backscattering spectroscopy during the sequential growth of CuAl2, CuAl, and Cu 9Al4 intermetallic compounds upon annealing in the temperature range 160-250 °C. The intrinsic interdiffusion coefficients of Al and Cu in each of these compounds have been determined by applying an analysis of marker motion in a binary diffusion couple to the measured displacement data. Moreover, the prefactor and activation energy of the individual diffusivities have been calculated as shown below by measuring the marker motion as a function of temperature. For CuAl2, D 0Al =0.4 cm2/s, QAl =1.25±0.05 eV, D0Cu =9.5 cm2/s, QCu =1.40±0.05 eV. For CuAl, D0Al =1.5×10-7 cm2/s, QAl =0.7±0.05 eV, D0Cu =1×10- 2 cm2/s, QCu =1.1±0.05 eV. For Cu 9Al4, D0Al =1.7×10- 3 cm2/s, QAl =1.20±0.05 eV, D 0Cu =2.4×10-2 cm2/s, Q Cu =1.30±0.05 eV. These values agree quite well to those chemical interdiffusion coefficients published in the literature for bulk samples. A discussion on sequential compound formation has been given on the basis of these measured values.

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to