Intelligent systems for reliability

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

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Author(s)

  • K. Aboura
  • N. D. Singpurwalla
  • R. Soyer

Detail(s)

Original languageEnglish
Title of host publicationIEEE International Symposium on Intelligent Control, 1988: August 24-26, Arlington Virginia : Proceedings (Ieee International Symposium on Intelligent Control//Proceedings)
PublisherInstitute of Electrical and Electronics Engineers, Inc.
Pages103-107
ISBN (print)818620129
Publication statusPublished - 1988
Externally publishedYes

Conference

TitleThird International Symposium on Intelligent Control 1988
CityArlington, VA, USA
Period24 - 26 August 1988

Link(s)

Check@CityULib
Link to Scopus https://www.scopus.com/record/display.uri?eid=2-s2.0-0024183333&origin=recordpage
Permanent Link https://scholars.cityu.edu.hk/en/publications/publication(31d341ec-59ab-41d2-b105-ba21f9284eed).html

Abstract

The authors discuss the use of expert opinion in reliability assessment. They present an approach for the analysis of life-length data that can be described by a Weibull distribution. They address the problem of predicting the number of defects due to fatigue in a railroad track. In both cases, a Bayesian approach is taken and procedures are developed and implemented on a personal computer.

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Publication fingerprints text

100
reliability INIS
100
Reliability Engineering
100
Bayesian Approach Engineering
100
Reliability Assessm... Engineering
100
Personal Computer Engineering
100
Expert Opinion Engineering
100
Data Length Engineering
100
Railroad Tracks Engineering
100
Weibull Distributio... Keyphrases
100
Defect numbers Keyphrases
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Citation Format(s)

[ RIS ] [ BibTeX ]
Intelligent systems for reliability. / Aboura, K.; Singpurwalla, N. D.; Soyer, R.
IEEE International Symposium on Intelligent Control, 1988: August 24-26, Arlington Virginia : Proceedings (Ieee International Symposium on Intelligent Control//Proceedings). Institute of Electrical and Electronics Engineers, Inc., 1988. p. 103-107.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review