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Integrated mobile device-based method for defect detection

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Abstract

Defect detection is essential for ensuring the safety and sustainability of natural and engineered infrastructure. Traditional non-destructive testing (NDT) methods often rely on bulky and costly equipment, limiting their applicability in real-world field conditions. This paper reviews the emerging trend of integrating NDT techniques with mobile devices and highlights our recent work on a mobile phone-based solution. By employing the phone’s speaker for acoustic excitation and its camera for motion magnification, the system enables sensitive detection of internal defects such as cavities and cracks without additional instrumentation. Experimental studies demonstrate the capability to identify defects as small as 1 mm and support a defect-sensitive scoring framework for quantitative health assessment. Beyond technical performance, this mobile device-based approach offers low cost, high scalability, and strong potential for public participation, aligning with global goals of resilience and sustainability. Future integration with artificial intelligence and unmanned aerial vehicles (UAVs) is envisioned to enable decentralized and intelligent infrastructure monitoring. © (2026) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).
Original languageEnglish
Title of host publicationNondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XX
EditorsH. Felix Wu, Andrew L. Gyekenyesi, Peter J. Shull, Tzuyang Yu
Place of PublicationUnited States
PublisherSPIE
ISBN (Electronic)9781510698420
ISBN (Print)9781510698413
DOIs
Publication statusOnline published - 15 Apr 2026
EventSPIE Smart Structures + Nondestructive Evaluation 2026 - Vancouver, Canada
Duration: 16 Mar 2026 → 19 Mar 2026

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume13950
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSPIE Smart Structures + Nondestructive Evaluation 2026
PlaceCanada
CityVancouver
Period16/03/26 → 19/03/26

Bibliographical note

Research Unit(s) information for this publication is provided by the author(s) concerned.

Research Keywords

  • Mobile device
  • Non-destructive testing
  • Defect detection
  • Sustainability

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