Inner surface ion implantation using deflecting electric field

Aiguo Liu, Xiaofeng Wang, Qingchuan Chen, Baoyin Tang, Paul K. Chu

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    8 Citations (Scopus)

    Abstract

    Because of its non line-of-sight nature, researchers have recently focused on plasma immersion ion implantation (PIII) to enhance the properties of inner surfaces of industrial components to combat wear and corrosion. However, theoretical simulation has shown a relatively dim prospect because of the limitation on impact energy and retained dose. In this paper, we describe a procedure to improve the efficiency of inner surface implantation by using a symmetrical experimental setup and deflecting electric field. Improvements of 43% and 71% are observed for the implantation depth and retained dose, respectively. Since a large portion of the ions implanted into the interior surface originate from outside of the bore, a longer pulse-width will be more beneficial. © 1998 Elsevier Science B.V. All rights reserved.
    Original languageEnglish
    Pages (from-to)306-310
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Volume143
    Issue number3
    DOIs
    Publication statusPublished - 1 Sept 1998

    Research Keywords

    • Inner surface modification
    • Plasma immersion ion implantation

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