Inhibiting the consumption of Cu during multiple reflows of Pb-free solder on Cu

H. Y. Hsiao, C. C. Hu, M. Y. Guo, C. Chen*, K. N. Tu

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

17 Citations (Scopus)

Abstract

An effective approach to inhibiting the consumption of Cu during multiple reflows of SnAg2.3 solder on Cu is reported. By depositing a very thin layer of solder on Cu, followed by a 10-min reflow, the scallop-type morphology of interfacial Cu6Sn5 intermetallic compounds (IMC) became flat, and the channels between them closed up. When additional solder was deposited on the sample and reflowed again, the consumption of Cu as well as the growth the IMC was retarded. © 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Original languageEnglish
Pages (from-to)907-910
JournalScripta Materialia
Volume65
Issue number10
Online published18 Aug 2011
DOIs
Publication statusPublished - Nov 2011
Externally publishedYes

Research Keywords

  • 3D-IC packaging
  • Diffusion
  • Intermetallic compound
  • Soldering

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