InGaN pn-junctions grown by PA-MBE: Material characterization and fabrication of nanocolumn electroluminescent devices

I. Gherasoiu*, K. M. Yu, L. Reichertz, W. Walukiewicz

*Corresponding author for this work

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    6 Citations (Scopus)

    Abstract

    PN junctions are basic building blocks of many electronic devices and their performance depends on the structural properties of the component layers and on the type and the amount of the doping impurities incorporated. Magnesium is the common p-type dopant for nitride semiconductors while silicon and more recently germanium are the n-dopants of choice. In this paper, therefore we analyze the quantitative limits for Mg and Ge incorporation on GaN and InGaN with high In content. We also discuss the challenges posed by the growth and characterization of InGaN pn-junctions and we discuss the properties of large area, long wavelength nanocolumn LEDs grown on silicon (1 1 1) by PA-MBE.
    Original languageEnglish
    Pages (from-to)393-397
    JournalJournal of Crystal Growth
    Volume425
    Online published12 Feb 2015
    DOIs
    Publication statusPublished - 1 Sept 2015

    Research Keywords

    • A1. Doping
    • A1. Nanostructures
    • A3. Molecular beam epitaxy
    • B1. Nitrides
    • B3. Light emitting diodes

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