In situ transmission electron microscope study of interface sliding and migration in an ultrafine lamellar structure
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 2453-2459 |
Journal / Publication | Journal of Materials Research |
Volume | 21 |
Issue number | 10 |
Publication status | Published - Oct 2006 |
Externally published | Yes |
Link(s)
Abstract
The instability of interfaces in an ultrafine TiAl-(γ)/Ti3Al-(α2) lamellar structure by straining at room temperature has been investigated using in situ straining techniques performed in a transmission electron microscope. The purpose of this study was to obtain experimental evidence to support the creep mechanisms based upon the interface sliding in association with a cooperative movement of interfacial dislocations, which was proposed previously to rationalize a nearly linear creep behavior of ultrafine lamellar TiAl alloys. The results reveal that the sliding and migration of lamellar interfaces can take place simultaneously as a result of the cooperative movement of interfacial dislocations, which can lead to an adverse effect in the performance of ultrafine lamellar TiAl alloy.
Citation Format(s)
In situ transmission electron microscope study of interface sliding and migration in an ultrafine lamellar structure. / Hsiung, L.M.; Zhou, J.; Nieh, T.G.
In: Journal of Materials Research, Vol. 21, No. 10, 10.2006, p. 2453-2459.
In: Journal of Materials Research, Vol. 21, No. 10, 10.2006, p. 2453-2459.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review