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In-situ TEM study of interface sliding and migration in an ultrafine lamellar structure

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

The stability of interfaces in an ultrafine TiAl-(γ)/Ti 3Al-(α2) lamellar structure by straining at room temperature has been investigated using in-situ straining techniques performed in a transmission electron microscope. The purpose of this study is to obtain experimental evidence to support the previously proposed creep mechanisms in ultrafine lamellar TiAl alloys based upon the interface sliding in association with a cooperative movement of interfacial dislocations. The results have revealed that both the sliding and migration of lamellar interfaces can take place simultaneously as a result of the cooperative motion of interfacial dislocations. © 2005 Materials Research Society.
Original languageEnglish
Title of host publicationMechanical Properties of Nanostructured Materials: Experiments and Modeling
Pages23-28
Volume880
Publication statusPublished - 2005
Externally publishedYes
Event2005 MRS Spring Meeting - San Franciso, CA, United States
Duration: 28 Mar 20051 Apr 2005

Publication series

NameMaterials Research Society Symposium Proceedings
Volume880
ISSN (Print)0272-9172

Conference

Conference2005 MRS Spring Meeting
PlaceUnited States
CitySan Franciso, CA
Period28/03/051/04/05

Bibliographical note

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