In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

Zhengkui Xu

doi:10.1016/S0921-5107(02)00430-0

In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

Zhengkui Xu

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

20 Citations (Scopus)

Abstract

Pb(Mg_1/3Nb_2/3)O3-PbTiO₃ (PMN-PT) single crystals exhibit ultrahigh piezoelectric coefficients and are the most promising candidates for the next generation of transducers, sensors and actuators. One critical problem that limits the device performance using these crystals is the fatigue degradation associated with the electric cycling. Microcracking is the most serious degradation phenomenon in these piezoelectric materials. In this work, in situ transmission electron microscopy (TEM) was used to investigate electric field-induced microcracking in PMN-PT single crystals. Microcrack initiation from a fine pore under a cyclic field and field-induced ferroelectric domain boundary cracking were directly observed in the piezoelectric single crystals. © 2002 Elsevier Science B.V. All rights reserved.

Original language	English
Pages (from-to)	106-111
Journal	Materials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume	99
Issue number	1-3
DOIs	https://doi.org/10.1016/S0921-5107(02)00430-0
Publication status	Published - 25 May 2003
Event	Advanced Electronic-ceramic Materials. Proceedings of the 8th IUMRS-ICEM 2002 - Xi'an, China Duration: 10 Jun 2002 → 14 Jun 2002

Research Keywords

Domain boundary
In situ TEM
Microcracking
Piezoelectric single crystals

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10.1016/S0921-5107(02)00430-0

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title = "In situ TEM study of electric field-induced microcracking in piezoelectric single crystals",

abstract = "Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT) single crystals exhibit ultrahigh piezoelectric coefficients and are the most promising candidates for the next generation of transducers, sensors and actuators. One critical problem that limits the device performance using these crystals is the fatigue degradation associated with the electric cycling. Microcracking is the most serious degradation phenomenon in these piezoelectric materials. In this work, in situ transmission electron microscopy (TEM) was used to investigate electric field-induced microcracking in PMN-PT single crystals. Microcrack initiation from a fine pore under a cyclic field and field-induced ferroelectric domain boundary cracking were directly observed in the piezoelectric single crystals. {\textcopyright} 2002 Elsevier Science B.V. All rights reserved.",

keywords = "Domain boundary, In situ TEM, Microcracking, Piezoelectric single crystals",

author = "Zhengkui Xu",

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doi = "10.1016/S0921-5107(02)00430-0",

language = "English",

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journal = "Materials Science and Engineering B: Solid-State Materials for Advanced Technology",

issn = "0921-5107",

publisher = "Elsevier Ltd.",

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note = "Advanced Electronic-ceramic Materials. Proceedings of the 8th IUMRS-ICEM 2002 ; Conference date: 10-06-2002 Through 14-06-2002",

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TY - JOUR

T1 - In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

AU - Xu, Zhengkui

PY - 2003/5/25

Y1 - 2003/5/25

N2 - Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT) single crystals exhibit ultrahigh piezoelectric coefficients and are the most promising candidates for the next generation of transducers, sensors and actuators. One critical problem that limits the device performance using these crystals is the fatigue degradation associated with the electric cycling. Microcracking is the most serious degradation phenomenon in these piezoelectric materials. In this work, in situ transmission electron microscopy (TEM) was used to investigate electric field-induced microcracking in PMN-PT single crystals. Microcrack initiation from a fine pore under a cyclic field and field-induced ferroelectric domain boundary cracking were directly observed in the piezoelectric single crystals. © 2002 Elsevier Science B.V. All rights reserved.

AB - Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT) single crystals exhibit ultrahigh piezoelectric coefficients and are the most promising candidates for the next generation of transducers, sensors and actuators. One critical problem that limits the device performance using these crystals is the fatigue degradation associated with the electric cycling. Microcracking is the most serious degradation phenomenon in these piezoelectric materials. In this work, in situ transmission electron microscopy (TEM) was used to investigate electric field-induced microcracking in PMN-PT single crystals. Microcrack initiation from a fine pore under a cyclic field and field-induced ferroelectric domain boundary cracking were directly observed in the piezoelectric single crystals. © 2002 Elsevier Science B.V. All rights reserved.

KW - Domain boundary

KW - In situ TEM

KW - Microcracking

KW - Piezoelectric single crystals

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UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0038715786&origin=recordpage

U2 - 10.1016/S0921-5107(02)00430-0

DO - 10.1016/S0921-5107(02)00430-0

M3 - RGC 21 - Publication in refereed journal

SN - 0921-5107

VL - 99

SP - 106

EP - 111

JO - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

JF - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

IS - 1-3

T2 - Advanced Electronic-ceramic Materials. Proceedings of the 8th IUMRS-ICEM 2002

Y2 - 10 June 2002 through 14 June 2002

ER -

In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

Abstract

Research Keywords

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