In situ observation of deformation-induced interface migration in a fully-lamellar TiAl alloy

L. M. Hsiung, A. J. Schwartz, T. G. Nieh

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

12 Citations (Scopus)
Original languageEnglish
Pages (from-to)1017-1022
JournalScripta Materialia
Volume36
Issue number9
DOIs
Publication statusPublished - 1 May 1997
Externally publishedYes

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