In situ Electrical Property Characterization of Individual Nanostructures Using a Sliding Probe Inside a Transmission Electron Microscope

Zheng Fan; Xinyong Tao; Yiping Li; Yingchao Yang; Jun Du; Wenkui Zhang; Hui Huang; Yongping Gan; Xiaodong Li; Lixin Dong

doi:10.1109/NMDC.2010.5652591

In situ Electrical Property Characterization of Individual Nanostructures Using a Sliding Probe Inside a Transmission Electron Microscope

Zheng Fan, Xinyong Tao, Yiping Li, Yingchao Yang, Jun Du, Wenkui Zhang, Hui Huang, Yongping Gan, Xiaodong Li, Lixin Dong

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

2 Citations (Scopus)

Abstract

A sliding probe technique has been developed for the in situ electrical property characterization of individual nanostructures inside a transmission electron microscope (TEM) using a nanomanipulator. Experimental investigation into the transport measurement of copper-filled carbon nanotubes, carbide nanowires, and carbon microfiber has shown the effectiveness of this method. Comparing with conventional 4-point methods, the proposed setup is simple and agile and it can be readily combined with TEM-based imaging and analysis. Comparing with conventional 2-point methods, the sliding probe method are characterized by (1) the contact resistance can be partially eliminated and (2) sectional measurement using this method is particularly adaptable to non-uniform structures or hetero-structures.

Original language	English
Title of host publication	2010 IEEE Nanotechnology Materials and Devices Conference
Pages	149-152
DOIs	https://doi.org/10.1109/NMDC.2010.5652591
Publication status	Published - Oct 2010
Externally published	Yes
Event	4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010) - Monterey, United States Duration: 12 Oct 2010 → 15 Oct 2010

Publication series

Name	IEEE Nanotechnology Materials and Devices Conference, NMDC

Conference

Conference	4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010)
Place	United States
City	Monterey
Period	12/10/10 → 15/10/10

Research Keywords

Electrical property
In situ technology
Nanomanipulation
Nanostructures
Sliding probe technique

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10.1109/NMDC.2010.5652591

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Fan, Z., Tao, X., Li, Y., Yang, Y., Du, J., Zhang, W., Huang, H., Gan, Y., Li, X., & Dong, L. (2010). In situ Electrical Property Characterization of Individual Nanostructures Using a Sliding Probe Inside a Transmission Electron Microscope. In 2010 IEEE Nanotechnology Materials and Devices Conference (pp. 149-152). Article 5652591 (IEEE Nanotechnology Materials and Devices Conference, NMDC). https://doi.org/10.1109/NMDC.2010.5652591

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title = "In situ Electrical Property Characterization of Individual Nanostructures Using a Sliding Probe Inside a Transmission Electron Microscope",

abstract = "A sliding probe technique has been developed for the in situ electrical property characterization of individual nanostructures inside a transmission electron microscope (TEM) using a nanomanipulator. Experimental investigation into the transport measurement of copper-filled carbon nanotubes, carbide nanowires, and carbon microfiber has shown the effectiveness of this method. Comparing with conventional 4-point methods, the proposed setup is simple and agile and it can be readily combined with TEM-based imaging and analysis. Comparing with conventional 2-point methods, the sliding probe method are characterized by (1) the contact resistance can be partially eliminated and (2) sectional measurement using this method is particularly adaptable to non-uniform structures or hetero-structures.",

keywords = "Electrical property, In situ technology, Nanomanipulation, Nanostructures, Sliding probe technique",

author = "Zheng Fan and Xinyong Tao and Yiping Li and Yingchao Yang and Jun Du and Wenkui Zhang and Hui Huang and Yongping Gan and Xiaodong Li and Lixin Dong",

year = "2010",

month = oct,

doi = "10.1109/NMDC.2010.5652591",

language = "English",

isbn = "9781424488964",

series = "IEEE Nanotechnology Materials and Devices Conference, NMDC",

pages = "149--152",

booktitle = "2010 IEEE Nanotechnology Materials and Devices Conference",

note = "4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010) ; Conference date: 12-10-2010 Through 15-10-2010",

}

Fan, Z, Tao, X, Li, Y, Yang, Y, Du, J, Zhang, W, Huang, H, Gan, Y, Li, X & Dong, L 2010, In situ Electrical Property Characterization of Individual Nanostructures Using a Sliding Probe Inside a Transmission Electron Microscope. in 2010 IEEE Nanotechnology Materials and Devices Conference., 5652591, IEEE Nanotechnology Materials and Devices Conference, NMDC, pp. 149-152, 4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010), Monterey, California, United States, 12/10/10. https://doi.org/10.1109/NMDC.2010.5652591

In situ Electrical Property Characterization of Individual Nanostructures Using a Sliding Probe Inside a Transmission Electron Microscope. / Fan, Zheng; Tao, Xinyong; Li, Yiping et al.
2010 IEEE Nanotechnology Materials and Devices Conference. 2010. p. 149-152 5652591 (IEEE Nanotechnology Materials and Devices Conference, NMDC).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - In situ Electrical Property Characterization of Individual Nanostructures Using a Sliding Probe Inside a Transmission Electron Microscope

AU - Fan, Zheng

AU - Tao, Xinyong

AU - Li, Yiping

AU - Yang, Yingchao

AU - Du, Jun

AU - Zhang, Wenkui

AU - Huang, Hui

AU - Gan, Yongping

AU - Li, Xiaodong

AU - Dong, Lixin

PY - 2010/10

Y1 - 2010/10

N2 - A sliding probe technique has been developed for the in situ electrical property characterization of individual nanostructures inside a transmission electron microscope (TEM) using a nanomanipulator. Experimental investigation into the transport measurement of copper-filled carbon nanotubes, carbide nanowires, and carbon microfiber has shown the effectiveness of this method. Comparing with conventional 4-point methods, the proposed setup is simple and agile and it can be readily combined with TEM-based imaging and analysis. Comparing with conventional 2-point methods, the sliding probe method are characterized by (1) the contact resistance can be partially eliminated and (2) sectional measurement using this method is particularly adaptable to non-uniform structures or hetero-structures.

AB - A sliding probe technique has been developed for the in situ electrical property characterization of individual nanostructures inside a transmission electron microscope (TEM) using a nanomanipulator. Experimental investigation into the transport measurement of copper-filled carbon nanotubes, carbide nanowires, and carbon microfiber has shown the effectiveness of this method. Comparing with conventional 4-point methods, the proposed setup is simple and agile and it can be readily combined with TEM-based imaging and analysis. Comparing with conventional 2-point methods, the sliding probe method are characterized by (1) the contact resistance can be partially eliminated and (2) sectional measurement using this method is particularly adaptable to non-uniform structures or hetero-structures.

KW - Electrical property

KW - In situ technology

KW - Nanomanipulation

KW - Nanostructures

KW - Sliding probe technique

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M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 9781424488964

SN - 9781424488971

T3 - IEEE Nanotechnology Materials and Devices Conference, NMDC

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BT - 2010 IEEE Nanotechnology Materials and Devices Conference

T2 - 4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010)

Y2 - 12 October 2010 through 15 October 2010

ER -

In situ Electrical Property Characterization of Individual Nanostructures Using a Sliding Probe Inside a Transmission Electron Microscope

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