In Situ Device-Level TEM Characterization Based on Ultra-Flexible Multilayer MoS2 Micro-Cantilever

Chaojian Hou (Co-first Author), Kun Wang (Co-first Author), Wenqi Zhang (Co-first Author), Donglei Chen, Xiaokai Wang, Lu Fan, Chunyang Li, Jing Zhao*, Lixin Dong*

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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