Improving atomic force microscopy imaging by a direct inverse asymmetric PI hysteresis model

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

18 Scopus Citations
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Author(s)

  • Dong Wang
  • Peng Yu
  • Feifei Wang
  • Lei Zhou
  • Zaili Dong
  • Lianqing Liu

Detail(s)

Original languageEnglish
Pages (from-to)3409-3425
Journal / PublicationSensors (Switzerland)
Volume15
Issue number2
Online published3 Feb 2015
Publication statusPublished - Feb 2015

Link(s)

Abstract

A modified Prandtl–Ishlinskii (PI) model, referred to as a direct inverse asymmetric PI (DIAPI) model in this paper, was implemented to reduce the displacement error between a predicted model and the actual trajectory of a piezoelectric actuator which is commonly found in AFM systems. Due to the nonlinearity of the piezoelectric actuator, the standard symmetric PI model cannot precisely describe the asymmetric motion of the actuator. In order to improve the accuracy of AFM scans, two series of slope parameters were introduced in the PI model to describe both the voltage-increase-loop (trace) and voltage-decrease-loop (retrace). A feedforward controller based on the DIAPI model was implemented to compensate hysteresis. Performance of the DIAPI model and the feedforward controller were validated by scanning micro-lenses and standard silicon grating using a custom-built AFM.

Research Area(s)

  • Atomic force microscope, Direct inverse asymmetric PI model, Feedforward control, Hysteresis, Piezoelectric actuator

Citation Format(s)

Improving atomic force microscopy imaging by a direct inverse asymmetric PI hysteresis model. / Wang, Dong; Yu, Peng; Wang, Feifei; Chan, Ho-Yin; Zhou, Lei; Dong, Zaili; Liu, Lianqing; Li, Wen Jung.

In: Sensors (Switzerland), Vol. 15, No. 2, 02.2015, p. 3409-3425.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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