@inproceedings{af540d25d4744776a51c9d61097ba8af,
title = "Imaging the near-field intensity gradients of a low power semiconductor laser",
abstract = "A newly developed inverted tapping-mode tuning-fork near-field scanning optical microscope is used to study the local near-field radiation properties of a strained AlGaInP/Ga0.4In0.6P low power visible multiquantum-well laser diode. With this novel technique, we can easily image the local near-field optical intensity gradients. In the intensity ratio image there are remarkable contrasts among the various regions on the laser diode facet. The anomalous phenomenon manifests the different origins of the near-field optical waves from various regions on the laser diode facet. We believe that this method should be very important for further understanding the optical radiation properties in the near-field region.",
author = "Lu, {Nien Hua} and Tsai, {Din Ping} and Lin, {Wei Yi} and Huang, {H. J.}",
year = "1999",
month = nov,
doi = "10.1117/12.370301",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE - International Society for Optical Engineering",
pages = "751--755",
editor = "Marek Osinski and Soo-Jin Chua and Chichibu, {Shigefusa F.}",
booktitle = "Design, Fabrication, and Characterization of Photonic Devices",
note = "International Symposium on Photonics and Applications ; Conference date: 29-11-1999 Through 03-12-1999",
}