@inproceedings{111a2b004fee451aa78bd009edd967fc,
title = "Imaging the evanescent intensity gradients of an optical waveguide using a tapping-mode near-field scanning optical microscope",
abstract = "Imaging the local evanescent intensity gradients by using a tapping-mode near-field scanning optical microscope is developed. Two different optical structures, one a well-characterized BK-7 glass prism in the total internal reflection configuration, and the other a side-polished optical fiber waveguide with a step index of refraction, were studied. Results show distinct imaging contrasts of the intensity gradients, and reveal the variations of the local index of refraction of waveguide. This is a novel near-field optical method, and can be used in the imaging of local index of refraction of a variety of optical waveguide structures.",
author = "Yang, \{Chi Wen\} and Tsai, \{Din Ping\} and Jackson, \{Howard E.\}",
year = "1999",
month = nov,
doi = "10.1117/12.370327",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE - International Society for Optical Engineering",
pages = "313--318",
editor = "Marek Osinski and Soo-Jin Chua and Chichibu, \{Shigefusa F.\}",
booktitle = "Design, Fabrication, and Characterization of Photonic Devices",
note = "International Symposium on Photonics and Applications ; Conference date: 29-11-1999 Through 03-12-1999",
}