Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

6 Scopus Citations
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Author(s)

  • Cheng Hung Chu
  • Bau Jung Wu
  • Tsung Sheng Kao
  • Yuan Hsing Fu
  • Hai-Pang Chiang

Detail(s)

Original languageEnglish
Article number4815988
Pages (from-to)2221-2223
Journal / PublicationIEEE Transactions on Magnetics
Volume45
Issue number5
Publication statusPublished - May 2009
Externally publishedYes

Abstract

The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. © 2009 IEEE.

Research Area(s)

  • Conductive-atomic force microscopy (C-AFM), Jitter, Recording mark, Writing strategy

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to lbscholars@cityu.edu.hk.

Citation Format(s)

Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output. / Chu, Cheng Hung; Wu, Bau Jung; Kao, Tsung Sheng et al.

In: IEEE Transactions on Magnetics, Vol. 45, No. 5, 4815988, 05.2009, p. 2221-2223.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review