Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

6 Scopus Citations
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Author(s)

  • Cheng Hung Chu
  • Bau Jung Wu
  • Tsung Sheng Kao
  • Yuan Hsing Fu
  • Hai-Pang Chiang

Detail(s)

Original languageEnglish
Article number4815988
Pages (from-to)2221-2223
Journal / PublicationIEEE Transactions on Magnetics
Volume45
Issue number5
Publication statusPublished - May 2009
Externally publishedYes

Abstract

The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. © 2009 IEEE.

Research Area(s)

  • Conductive-atomic force microscopy (C-AFM), Jitter, Recording mark, Writing strategy

Bibliographic Note

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Citation Format(s)

Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output. / Chu, Cheng Hung; Wu, Bau Jung; Kao, Tsung Sheng et al.
In: IEEE Transactions on Magnetics, Vol. 45, No. 5, 4815988, 05.2009, p. 2221-2223.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review