Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 4815988 |
Pages (from-to) | 2221-2223 |
Journal / Publication | IEEE Transactions on Magnetics |
Volume | 45 |
Issue number | 5 |
Publication status | Published - May 2009 |
Externally published | Yes |
Link(s)
Abstract
The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance. © 2009 IEEE.
Research Area(s)
- Conductive-atomic force microscopy (C-AFM), Jitter, Recording mark, Writing strategy
Bibliographic Note
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Citation Format(s)
Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output. / Chu, Cheng Hung; Wu, Bau Jung; Kao, Tsung Sheng et al.
In: IEEE Transactions on Magnetics, Vol. 45, No. 5, 4815988, 05.2009, p. 2221-2223.
In: IEEE Transactions on Magnetics, Vol. 45, No. 5, 4815988, 05.2009, p. 2221-2223.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review