In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

Yang Lu; Yajing Shen; Xinyu Liu; Mohd Ridzuan Bin Ahmad; Yan Chen

doi:10.1155/2017/8016571

In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

Yang Lu^*
, Yajing Shen
, Xinyu Liu
, Mohd Ridzuan Bin Ahmad
, Yan Chen

^*Corresponding author for this work

Research output: Journal Publications and Reviews › Editorial Preface

1 Citation (Scopus)

71 Downloads (CityUHK Scholars)

Original language	English
Article number	8016571
Journal	Scanning
Volume	2017
Online published	5 Nov 2017
DOIs	https://doi.org/10.1155/2017/8016571
Publication status	Published - 2017

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Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).

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This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/

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@article{6419d8e5835745d494dff1e4f0a1178f,

title = "In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization",

author = "Yang Lu and Yajing Shen and Xinyu Liu and Ahmad, \{Mohd Ridzuan Bin\} and Yan Chen",

note = "Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).",

year = "2017",

doi = "10.1155/2017/8016571",

language = "English",

volume = "2017",

journal = "Scanning",

issn = "0161-0457",

publisher = "John Wiley \& Sons",

}

TY - JOUR

T1 - In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

AU - Lu, Yang

AU - Shen, Yajing

AU - Liu, Xinyu

AU - Ahmad, Mohd Ridzuan Bin

AU - Chen, Yan

N1 - Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).

PY - 2017

Y1 - 2017

UR - https://www.scopus.com/pages/publications/85042430407

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85042430407&origin=recordpage

U2 - 10.1155/2017/8016571

DO - 10.1155/2017/8016571

M3 - Editorial Preface

C2 - 29238439

SN - 0161-0457

VL - 2017

JO - Scanning

JF - Scanning

M1 - 8016571

ER -

In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

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