Identification of local silicon cluster nanostructures inside Si xGe1-x alloy nanocrystals by Raman spectroscopy

L. Z. Liu; X. L. Wu; J. C. Shen; T. H. Li; F. Gao; Paul K. Chu

doi:10.1039/c0cc01277g

Identification of local silicon cluster nanostructures inside Si _xGe_1-x alloy nanocrystals by Raman spectroscopy

L. Z. Liu
, X. L. Wu
, J. C. Shen
, T. H. Li
, F. Gao
, Paul K. Chu

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

16 Citations (Scopus)

Abstract

By experimentally examining and theoretically analyzing the Raman spectra of Si_xGe_1-x nanocrystal-embedded silica films, we show that the 430 cm^-1 Si-Si optical phonon mode can be used as a fingerprint to identify the existence of local silicon cluster nanostructures inside Si_xGe_1-x nanocrystals with high silicon content. © The Royal Society of Chemistry 2010.

Original language	English
Pages (from-to)	5539-5541
Journal	Chemical Communications
Volume	46
Issue number	30
DOIs	https://doi.org/10.1039/c0cc01277g
Publication status	Published - 14 Aug 2010

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@article{47214cd267804ce587319f0050cb17b0,

title = "Identification of local silicon cluster nanostructures inside Si xGe1-x alloy nanocrystals by Raman spectroscopy",

abstract = "By experimentally examining and theoretically analyzing the Raman spectra of SixGe1-x nanocrystal-embedded silica films, we show that the 430 cm-1 Si-Si optical phonon mode can be used as a fingerprint to identify the existence of local silicon cluster nanostructures inside SixGe1-x nanocrystals with high silicon content. {\textcopyright} The Royal Society of Chemistry 2010.",

author = "Liu, \{L. Z.\} and Wu, \{X. L.\} and Shen, \{J. C.\} and Li, \{T. H.\} and F. Gao and Chu, \{Paul K.\}",

year = "2010",

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TY - JOUR

T1 - Identification of local silicon cluster nanostructures inside Si xGe1-x alloy nanocrystals by Raman spectroscopy

AU - Liu, L. Z.

AU - Wu, X. L.

AU - Shen, J. C.

AU - Li, T. H.

AU - Gao, F.

AU - Chu, Paul K.

PY - 2010/8/14

Y1 - 2010/8/14

N2 - By experimentally examining and theoretically analyzing the Raman spectra of SixGe1-x nanocrystal-embedded silica films, we show that the 430 cm-1 Si-Si optical phonon mode can be used as a fingerprint to identify the existence of local silicon cluster nanostructures inside SixGe1-x nanocrystals with high silicon content. © The Royal Society of Chemistry 2010.

AB - By experimentally examining and theoretically analyzing the Raman spectra of SixGe1-x nanocrystal-embedded silica films, we show that the 430 cm-1 Si-Si optical phonon mode can be used as a fingerprint to identify the existence of local silicon cluster nanostructures inside SixGe1-x nanocrystals with high silicon content. © The Royal Society of Chemistry 2010.

UR - https://www.scopus.com/pages/publications/77954788698

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-77954788698&origin=recordpage

U2 - 10.1039/c0cc01277g

DO - 10.1039/c0cc01277g

M3 - RGC 21 - Publication in refereed journal

SN - 0009-241X

VL - 46

SP - 5539

EP - 5541

JO - Chemical Communications

JF - Chemical Communications

IS - 30

ER -