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HYPER-CIM: Hierarchical Predictive Exploration and Realizable Design Flow for High-Efficient Digital CIM

  • An Guo (Co-first Author)
  • , Yuhui Shi
  • , Yuhuai Zhang
  • , Tianhui Jiao
  • , Xiaoxue Zhong
  • , Defa Wu
  • , Arindam Basu
  • , Xin Si* (Co-last Author)
  • , Jun Yang* (Co-last Author)
  • *Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

Computing-in-Memory (CIM) is a promising solution to the memory wall, yet most prior studies optimize only one level—macro, accelerator, or architecture—rather than the full stack. This work presents HYPER-CIM, a hierarchical predictive exploration and realizable design flow that integrates all three levels. We build a scalable, fully digital CIM template in 28 nm with tunable accumulation length, local storage length, precision, parallel channels, and pipeline depth. More than 8k silicon-consistent design points were used to train a multi-head hierarchical circuit-optimization (MHCO) surrogate model, which predicts power, performance, and area (PPA) across 297M configurations. The resulting CIM "white-box" model offers circuit-faithful visibility for architecture-level design-space exploration (DSE) and Pareto search. Guided by this flow, we fabricated and silicon-verified four processing-element (PE)-flow CIM macros and one cross-level-flow CIM (CF-CIM) macro in 28 nm CMOS technology. Based on chip test results, the best-performing macro achieves 90.8 TOPS/W and 1.23 TOPS/mm², yielding a figure-of-merit (FoM) improvement of 31.12×–3.8×10⁶× over prior CIM designs. Under identical specifications, the CF-CIM improves energy efficiency from 52.13 TOPS/W to 67.9 TOPS/W and area efficiency from 0.41 TOPS/mm² to 0.51 TOPS/mm².
Original languageEnglish
Title of host publication2026 63rd ACM/IEEE Design Automation Conference (DAC)
Publication statusOnline published - Jul 2026
Event63rd ACM/IEEE Design Automation Conference (DAC 2026) - Long Beach, United States
Duration: 26 Jul 202629 Jul 2026
https://dac.com/2026

Conference

Conference63rd ACM/IEEE Design Automation Conference (DAC 2026)
Abbreviated titleDAC 2026
PlaceUnited States
CityLong Beach
Period26/07/2629/07/26
Internet address

Bibliographical note

Research Unit(s) information for this publication is provided by the author(s) concerned.

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