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Hot-stage transmission electron microscopy study of phase transformations in hexacelsian (BaAl2Si2O8)

  • Zhengkui Xu
  • , James L. Shull Jr.
  • , Waltraud M. Kriven

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Abstract

    Phase transformations in synthetic hexacelsian were investigated by hot-stage transmission electron microscopy. A second phase transformation from an orthorhombic to hexagonal structure was identified in the synthetic hexacelsian at approximately 700°C. The hexacelsian was found to exhibit a sequence of phase transformations on heating of hexagonal (P63/mcm)-orthorhombic (Immm)-hexagonal (P6/mmm). Antiphase domain boundaries, which were observed in P63/mcm and Immm phases, were absent in the P6/mmm phase. Crystal symmetries of the three phases were determined by convergent beam electron diffraction, and space group symmetries were derived by comparison of experimental selected area electron diffraction patterns with computer-simulated patterns.
    Original languageEnglish
    Pages (from-to)1287-1297
    JournalJournal of Materials Research
    Volume17
    Issue number6
    DOIs
    Publication statusPublished - Jun 2002

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