High-Yield Exfoliation of Ultrathin Two-Dimensional Ternary Chalcogenide Nanosheets for Highly Sensitive and Selective Fluorescence DNA Sensors

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Peng Yu
  • Yanling Hu
  • Junze Chen
  • Ying Huang
  • Yongqing Cai
  • Zhimin Luo
  • Bing Li
  • Qipeng Lu
  • Lianhui Wang
  • Zheng Liu

Detail(s)

Original languageEnglish
Pages (from-to)10430-10436
Journal / PublicationJournal of the American Chemical Society
Volume137
Issue number32
Online published4 Aug 2015
Publication statusPublished - 19 Aug 2015
Externally publishedYes

Abstract

High-yield preparation of ultrathin two-dimensional (2D) nanosheets is of great importance for the further exploration of their unique properties and promising applications. Herein, for the first time, the high-yield and scalable production of ultrathin 2D ternary chalcogenide nanosheets, including Ta2NiS5 and Ta2NiSe5 , in solution is achieved by exfoliating their layered microflakes. The size of resulting Ta2NiS5 and Ta2NiS5 nanosheets ranges from tens of nanometers to few micrometers. Importantly, the production yield of single-layer Ta2NiS5 nanosheets is very high, ca. 86%. As a proof-of-concept application, the single-layer Ta2NiS5 is used as a novel fluorescence sensing platform for the detection of DNA with excellent selectivity and high sensitivity (with detection limit of 50 pM). These solution-processable, high-yield, large-amount ternary chalcogenide nanosheets may also have potential applications in electrocatalysis, supercapacitors, and electronic devices.

Citation Format(s)

High-Yield Exfoliation of Ultrathin Two-Dimensional Ternary Chalcogenide Nanosheets for Highly Sensitive and Selective Fluorescence DNA Sensors. / Tan, Chaoliang; Yu, Peng; Hu, Yanling et al.

In: Journal of the American Chemical Society, Vol. 137, No. 32, 19.08.2015, p. 10430-10436.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review