High-energy synchrotron radiation X-ray diffraction measurements during in situ aging of a NiTi-15 at. % Hf high temperature shape memory alloy

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Author(s)

  • Matthew Carl
  • Jesse Smith
  • Robert W. Wheeler
  • Brian Van Doren
  • Marcus L. Young

Detail(s)

Original languageEnglish
Article number100220
Journal / PublicationMaterialia
Volume5
Publication statusPublished - 1 Mar 2019
Externally publishedYes

Abstract

NiTiHf high temperature shape memory alloys (HTSMAs) have begun to show considerable progress in their ability to be manufactured and are now on the cusp of becoming viable alloys for use in the aerospace industry, mainly as actuation devices. By aging the alloys at intermediate temperatures between 450 and up to 700 °C, Ni-rich NiTiHf HTSMAs form the H-phase, a Ni-rich nanoscale precipitate which can be used to strengthen the alloy and improve the shape memory response; however, precipitate phase evolution and growth has not yet been studied in-situ nor have the effects of previous thermo-mechanical processing on their formation. In this study, H-phase precipitate formation is observed experimentally in situ during aging of a Ni-rich NiTiHf alloy using high energy synchrotron radiation X-ray diffraction (SR-XRD) measurements. The effects of prior thermo-mechanical treatments, i.e. hot and cold rolling, on its formation rate and coarsening rate are compared. It is shown that growth of the H-phase can be observed in situ using SR-XRD and the H-phase formation rate seems to exhibit linear growth when aging at 550 °C, while increasing the temperature to 650 °C shows a logarithmic trend that plateaus after approximately 1 h of aging. Other properties such as incubation time, austenite lattice strains, texture evolution, and overall comparison between hot and cold rolling are discussed. New potential peak age conditions are suggested based on the diffraction data and evaluated using three-point bending and TEM imaging.

Research Area(s)

  • NiTi, NiTiHf, Precipitation kinetics, Shape memory alloys (SMA), Synchrotron diffraction

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