High-Cycle Fatigue of Polycrystalline Silicon Thin Films in Laboratory Air
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | EE5.8 |
Pages (from-to) | EE5.8.1-EE5.8.6 |
Journal / Publication | Materials Research Society Symposium - Proceedings |
Volume | 657 |
Publication status | Published - Nov 2001 |
Externally published | Yes |
Meeting
Title | 2000 Materials Research Society Fall Meeting |
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Place | United States |
City | Boston |
Period | 27 November - 1 December 2000 |
Link(s)
Abstract
When subjected to alternating stresses, most materials degrade, e.g., suffer premature failure, due to a phenomenon known as fatigue. It is generally accepted that in brittle materials, such as ceramics, cyclic fatigue can only take place where there is some degree of toughening, implying that premature fatigue failure would not be expected in polycrystalline silicon where such toughening is absent. However, the fatigue failure of polysilicon is reported in the present work, based on tests on thirteen thin-film (2 μm thick) specimens cycled to failure in laboratory air (∼25°C, 30-50% relative humidity), where damage accumulation and failure of the notched cantilever beams were monitored electrically during the test. Specimen lives ranged from about 10 seconds to 34 days (5 × 105 to 1 × 1011 cycles) with the stress amplitude at failure being reduced to ∼50% of the low-cycle strength for lives in excess of 109 cycles.
Citation Format(s)
High-Cycle Fatigue of Polycrystalline Silicon Thin Films in Laboratory Air. / Muhlstein, C. L.; Brown, S. B.; Ritchie, R. O.
In: Materials Research Society Symposium - Proceedings, Vol. 657, EE5.8, 11.2001, p. EE5.8.1-EE5.8.6.
In: Materials Research Society Symposium - Proceedings, Vol. 657, EE5.8, 11.2001, p. EE5.8.1-EE5.8.6.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review