TY - GEN
T1 - High resolution TEM and nano-beam structural/compositional analysis of ultra-thin films in GMR sensor
AU - Huang, Rong-Tan
AU - Chen, Fu-Rong
AU - Kai, Ji-Jung
AU - Tsu, I-Fei
PY - 2000/4
Y1 - 2000/4
N2 - The structure and composition of the ultra-thin film in a giant magnetoresistance (GMR) device were studied using a field emission gun TEM (FEG TEM) equipped with energy dispersive x-ray spectroscopy (EDS) and energy filter systems. Focus was on the sandwich structure of the CoFe/Cu/CoFe multilayers. By way of analysis, the change of the thickness of Cu film or another was determined. Based on this observation, the degradation of magnetoresistance in the sensor was followed.
AB - The structure and composition of the ultra-thin film in a giant magnetoresistance (GMR) device were studied using a field emission gun TEM (FEG TEM) equipped with energy dispersive x-ray spectroscopy (EDS) and energy filter systems. Focus was on the sandwich structure of the CoFe/Cu/CoFe multilayers. By way of analysis, the change of the thickness of Cu film or another was determined. Based on this observation, the degradation of magnetoresistance in the sensor was followed.
UR - https://www.scopus.com/pages/publications/17144434573
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-17144434573&origin=recordpage
U2 - 10.1109/INTMAG.2000.872249
DO - 10.1109/INTMAG.2000.872249
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 0-7803-5943-7
T3 - Digests of the Intermag Conference
BT - INTERMAG 2000 DIGEST OF TECHNICAL PAPERS
PB - IEEE
T2 - 2000 IEEE International Magnetics Conference, INTERMAG 2000
Y2 - 9 April 2000 through 13 April 2000
ER -