High Resolution Electron Microscopy of Cu/MgO and Pd/MgO Interfaces

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)373-380
Journal / PublicationMaterials Science Forum
Volume189-190
Early online date11 Jul 1995
Publication statusPublished - 1995
Externally publishedYes

Conference

Title2nd International Conference on the Role of Interfaces in Advanced Materials Design, Processing and Performance
PlaceAustralia
CityBallarat
Period1 - 5 November 1993

Abstract

Cu/ (11̄1) MgO and Pd/ (11̄1) MgO interfaces with a cube-on-cube relation are produced by internal oxidation technique. High resolution transmission electron microscopy has been applied to study the interface structure of Cu/ (11̄1) MgO and Pd/ (11̄1) MgO. In contrast to a previous work in which cases the core structure of interfacial dislocation in Cu/ (11̄1) MgO and Pd/ (11̄1) MgO interfaces can not be directly observed from the high resolution image, we have observed the localized interfacial dislocation in both Cu/(11̄1) MgO and Pd/ (11̄1) MgO interfaces from high resolution images. The atomic structure of these two metal/oxide interfaces are determined from through-focal series of high resolution images. The terminating lattice plane in the interface is the oxygen lattice plane for both Cu/ (11̄1) MgO and Pd/ (11̄1) MgO interfaces which are composed of the distorted structural units of Cu2O and PdO, respectively. Junction dislocation resemble to that in the grain boundary facets related to the difference of the rigid body translations between two energetically equivalent {11̄1} facets in the Cu/ MgO and Pd/ MgO interfaces is observed. The Burgers vector of the junction dislocation is 1/6 〈112〉 and a stacking fault in the soft metal matrix accompanying with this junction dislocation is found.

Research Area(s)

  • High Resolution Electron Microscopy, Interfaces of Cu/Mgo and Pd/Mgo

Citation Format(s)

High Resolution Electron Microscopy of Cu/MgO and Pd/MgO Interfaces. / Chen, F.-R.; Chang, L.; Chiou, S.K.; Hong, C.S.

In: Materials Science Forum, Vol. 189-190, 1995, p. 373-380.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review