TY - JOUR
T1 - High quality ZnO
T2 - Al transparent conducting oxide films synthesized by pulsed filtered cathodic arc deposition
AU - Anders, André
AU - Lim, Sunnie H.N.
AU - Yu, Kin Man
AU - Andersson, Joakim
AU - Rosén, Johanna
AU - McFarland, Mike
AU - Brown, Jeff
PY - 2010/4/2
Y1 - 2010/4/2
N2 - Aluminum-doped zinc oxide, ZnO:Al or AZO, is a well-known n-type transparent conducting oxide with great potential in a number of applications currently dominated by indium tin oxide. In this study, the optical and electrical properties of AZO thin films deposited on glass and silicon by pulsed filtered cathodic arc deposition are systematically studied. In contrast to magnetron sputtering, this technique does not produce energetic negative ions, and therefore ion damage can be minimized. The quality of the AZO films strongly depends on growth temperature while only marginal improvements are obtained with post-deposition annealing. The best films, grown at a temperature of about 200 °C, have resistivities in the low to mid 10- 4 Ω cm range with a transmittance better than 85% in the visible part of the spectrum. It is remarkable that relatively good films of small thickness (60 nm) can be fabricated using this method. © 2009 Elsevier B.V.
AB - Aluminum-doped zinc oxide, ZnO:Al or AZO, is a well-known n-type transparent conducting oxide with great potential in a number of applications currently dominated by indium tin oxide. In this study, the optical and electrical properties of AZO thin films deposited on glass and silicon by pulsed filtered cathodic arc deposition are systematically studied. In contrast to magnetron sputtering, this technique does not produce energetic negative ions, and therefore ion damage can be minimized. The quality of the AZO films strongly depends on growth temperature while only marginal improvements are obtained with post-deposition annealing. The best films, grown at a temperature of about 200 °C, have resistivities in the low to mid 10- 4 Ω cm range with a transmittance better than 85% in the visible part of the spectrum. It is remarkable that relatively good films of small thickness (60 nm) can be fabricated using this method. © 2009 Elsevier B.V.
KW - Aluminum-doped zinc oxide
KW - Filtered cathodic arc
KW - Transparent conducting oxide
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U2 - 10.1016/j.tsf.2009.10.006
DO - 10.1016/j.tsf.2009.10.006
M3 - RGC 21 - Publication in refereed journal
SN - 0040-6090
VL - 518
SP - 3313
EP - 3319
JO - Thin Solid Films
JF - Thin Solid Films
IS - 12
ER -