High conductivity nickel oxide thin films by a facile sol-gel method
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 291-295 |
| Journal / Publication | Materials Letters |
| Volume | 92 |
| Online published | 6 Nov 2012 |
| Publication status | Published - 1 Feb 2013 |
Link(s)
Abstract
Li-doped NiO thin films (Li:NiO) were deposited on glass substrates using a facile sol-gel method. The effects of Li doping concentration on the structural, electrical and optical properties of Li:NiO films were examined. The structural properties of Li:NiO films were characterized by X-ray diffraction (XRD) and field emission scanning electron microscopy. XRD revealed the Li:NiO films to have a polycrystalline bunsenite structure. The surface morphology of the Li:NiO films exhibited nanocrystalline grains with a randomly oriented morphology. The resistivity decreased substantially to 1.33 k Ω cm at 0.11 mol%, which is one order of magnitude lower than that of the undoped NiO film. The mean transmittance decreased from 70% to 60% with increasing Li doping concentration from 0.02 mol% to 0.19 mol%. © 2012 Elsevier B.V.
Research Area(s)
- Li-doping, Mobility, NiO, Sol-gel, Transmittance
Citation Format(s)
High conductivity nickel oxide thin films by a facile sol-gel method. / Guo, Wen; Hui, K. N.; Hui, K. S.
In: Materials Letters, Vol. 92, 01.02.2013, p. 291-295.
In: Materials Letters, Vol. 92, 01.02.2013, p. 291-295.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
