Haptic sensing and modeling of nanomanipulation with an AFM

L. M. Fok; Y. H. Liu; Wen J. Li

doi:10.1109/ROBIO.2004.1521821

Haptic sensing and modeling of nanomanipulation with an AFM

L. M. Fok, Y. H. Liu^*, Wen J. Li

^*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

4 Citations (Scopus)

Abstract

This paper describes a virtual reality and haptic interface between human and the Atomic Force Microscope (AFM), which allows the operator to sense and touch the surface and nanoparticles during the manipulation with an AFM tip. The tip-sample interaction forces and intermolecular forces between the tip and surface are modeled based on Lennard-Jones potential and JKR theory, respectively. Our objective is to provide a 3D virtual reality interface capable of displaying topography of surface for the users and allow them to predict the results for the manipulation. © 2004 IEEE.

Original language	English
Title of host publication	Proceedings - 2004 IEEE International Conference on Robotics and Biomimetics, IEEE ROBIO 2004
Publisher	IEEE
Pages	452-457
ISBN (Print)	0780386418, 9780780386419
DOIs	https://doi.org/10.1109/ROBIO.2004.1521821
Publication status	Published - Aug 2004
Externally published	Yes
Event	2004 IEEE International Conference on Robotics and Biomimetics (ROBIO 2004) - Shenyang, China Duration: 22 Aug 2004 → 26 Aug 2004

Conference

Conference	2004 IEEE International Conference on Robotics and Biomimetics (ROBIO 2004)
Place	China
City	Shenyang
Period	22/08/04 → 26/08/04

Research Keywords

Atomic Force Microscope
Haptic Interface
Nanomanipulation
Virtual Reality

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10.1109/ROBIO.2004.1521821

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title = "Haptic sensing and modeling of nanomanipulation with an AFM",

abstract = "This paper describes a virtual reality and haptic interface between human and the Atomic Force Microscope (AFM), which allows the operator to sense and touch the surface and nanoparticles during the manipulation with an AFM tip. The tip-sample interaction forces and intermolecular forces between the tip and surface are modeled based on Lennard-Jones potential and JKR theory, respectively. Our objective is to provide a 3D virtual reality interface capable of displaying topography of surface for the users and allow them to predict the results for the manipulation. {\textcopyright} 2004 IEEE.",

keywords = "Atomic Force Microscope, Haptic Interface, Nanomanipulation, Virtual Reality",

author = "Fok, {L. M.} and Liu, {Y. H.} and Li, {Wen J.}",

year = "2004",

month = aug,

doi = "10.1109/ROBIO.2004.1521821",

language = "English",

isbn = "0780386418",

pages = "452--457",

booktitle = "Proceedings - 2004 IEEE International Conference on Robotics and Biomimetics, IEEE ROBIO 2004",

publisher = "IEEE",

address = "United States",

note = "2004 IEEE International Conference on Robotics and Biomimetics (ROBIO 2004) ; Conference date: 22-08-2004 Through 26-08-2004",

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TY - GEN

T1 - Haptic sensing and modeling of nanomanipulation with an AFM

AU - Fok, L. M.

AU - Liu, Y. H.

AU - Li, Wen J.

PY - 2004/8

Y1 - 2004/8

N2 - This paper describes a virtual reality and haptic interface between human and the Atomic Force Microscope (AFM), which allows the operator to sense and touch the surface and nanoparticles during the manipulation with an AFM tip. The tip-sample interaction forces and intermolecular forces between the tip and surface are modeled based on Lennard-Jones potential and JKR theory, respectively. Our objective is to provide a 3D virtual reality interface capable of displaying topography of surface for the users and allow them to predict the results for the manipulation. © 2004 IEEE.

AB - This paper describes a virtual reality and haptic interface between human and the Atomic Force Microscope (AFM), which allows the operator to sense and touch the surface and nanoparticles during the manipulation with an AFM tip. The tip-sample interaction forces and intermolecular forces between the tip and surface are modeled based on Lennard-Jones potential and JKR theory, respectively. Our objective is to provide a 3D virtual reality interface capable of displaying topography of surface for the users and allow them to predict the results for the manipulation. © 2004 IEEE.

KW - Atomic Force Microscope

KW - Haptic Interface

KW - Nanomanipulation

KW - Virtual Reality

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UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-28344448086&origin=recordpage

U2 - 10.1109/ROBIO.2004.1521821

DO - 10.1109/ROBIO.2004.1521821

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 0780386418

SN - 9780780386419

SP - 452

EP - 457

BT - Proceedings - 2004 IEEE International Conference on Robotics and Biomimetics, IEEE ROBIO 2004

PB - IEEE

T2 - 2004 IEEE International Conference on Robotics and Biomimetics (ROBIO 2004)

Y2 - 22 August 2004 through 26 August 2004

ER -

Haptic sensing and modeling of nanomanipulation with an AFM

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