Growth of single-crystalline RuO2 nanowires with one- and two-nanocontact electrical characterizations

Yee-Lang Liu, Zong-Yi Wu, Kuei-Jiun Lin, Jr-Jeng Huang, Fu-Rong Chen, Ji-Jung Kai*, Yong-Han Lin, Wen-Bin Jian*, Juhn-Jong Lin

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

25 Citations (Scopus)

Abstract

Single-crystalline Ru O2 nanowires were grown by using a thermal evaporation method. A control of the sizes (width and length) and the length-to-width ratio of the nanowires were achieved by tuning the growth time. A transmission electron microscope-scanning tunneling microscope technique invoking one-nanocontact electrical characterization was adopted to determine the room-temperature resistivity (∼100 μ cm) of the nanowires. An e-beam lithography technique facilitating two-nanocontact measurements was performed to establish the metallic characteristic of individual nanowires. The authors found that a nanocontact may introduce high contact resistance, nonlinear current-voltage characteristics, and even semiconducting behavior in the temperature dependent resistance. © 2007 American Institute of Physics.
Original languageEnglish
Article number13105
JournalApplied Physics Letters
Volume90
Issue number1
DOIs
Publication statusPublished - 2007
Externally publishedYes

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