Abstract
Epitaxial (1-x)BaTiO 3-xBi(Mg 0.5Ti 0.5) O 3 films with x 0 - 0.9 were grown on (111)cSrRuO 3(111) SrTiO 3 substrates by pulsed laser deposition (PLD). Plotting the temperature where dielectric constant reaches a maximum {T[ε r(max.)]} versus Bi(Mg 0.5,Ti 0.5)O 3 content present minimum at x 0.1. On the other hand, the remanent polarization (Pr) and the effective transverse piezoelectric constant [d 33(eff.)] showed minimum at 0.1 and 0.2, respectively, but increased with the increase of x in (1-x)BaTiO 3-xBi(Mg 0.5Ti 0.5)O 3 above these values. These results show the simultaneous increase of T[ε r(max.)] and d 33(eff.) for the films above x 0.2 that normally showed treads off characteristics. © 2012 American Institute of Physics.
| Original language | English |
|---|---|
| Article number | 084108 |
| Journal | Journal of Applied Physics |
| Volume | 111 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 15 Apr 2012 |
| Externally published | Yes |
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