Growth of (111)-oriented BaTiO 3-Bi(Mg 0.5Ti 0.5)O 3 epitaxial films and their crystal structure and electrical property characterizations

Hidenori Tanaka; Mohamed-Tahar Chentir; Tomoaki Yamada; Shintaro Yasui; Yoshitaka Ehara; Keisuke Yamato; Yuta Kashiwagi; Ngeah Theng Chua; Junling Wang; Soichiro Okamura; Hiroshi Uchida; Takashi Iijima; Satoshi Wada; Hiroshi Funakubo

doi:10.1063/1.4704384

Growth of (111)-oriented BaTiO ₃-Bi(Mg _0.5Ti _0.5)O ₃ epitaxial films and their crystal structure and electrical property characterizations

Hidenori Tanaka, Mohamed-Tahar Chentir, Tomoaki Yamada, Shintaro Yasui, Yoshitaka Ehara, Keisuke Yamato, Yuta Kashiwagi, Ngeah Theng Chua, Junling Wang, Soichiro Okamura, Hiroshi Uchida, Takashi Iijima, Satoshi Wada, Hiroshi Funakubo

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

15 Citations (Scopus)

Abstract

Epitaxial (1-x)BaTiO ₃-xBi(Mg _0.5Ti _0.5) O ₃ films with x 0 - 0.9 were grown on (111)cSrRuO ₃(111) SrTiO ₃ substrates by pulsed laser deposition (PLD). Plotting the temperature where dielectric constant reaches a maximum {T[ε _r(max.)]} versus Bi(Mg _0.5,Ti _0.5)O ₃ content present minimum at x 0.1. On the other hand, the remanent polarization (Pr) and the effective transverse piezoelectric constant [d ₃₃(eff.)] showed minimum at 0.1 and 0.2, respectively, but increased with the increase of x in (1-x)BaTiO ₃-xBi(Mg _0.5Ti _0.5)O ₃ above these values. These results show the simultaneous increase of T[ε _r(max.)] and d ₃₃(eff.) for the films above x 0.2 that normally showed treads off characteristics. © 2012 American Institute of Physics.

Original language	English
Article number	084108
Journal	Journal of Applied Physics
Volume	111
Issue number	8
DOIs	https://doi.org/10.1063/1.4704384
Publication status	Published - 15 Apr 2012
Externally published	Yes

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Tanaka, H., Chentir, M.-T., Yamada, T., Yasui, S., Ehara, Y., Yamato, K., Kashiwagi, Y., Chua, N. T., Wang, J., Okamura, S., Uchida, H., Iijima, T., Wada, S., & Funakubo, H. (2012). Growth of (111)-oriented BaTiO ₃-Bi(Mg _0.5Ti _0.5)O ₃ epitaxial films and their crystal structure and electrical property characterizations. Journal of Applied Physics, 111(8), Article 084108. https://doi.org/10.1063/1.4704384

@article{b05b8f572c9f4c519c2c808c80bce259,

title = "Growth of (111)-oriented BaTiO 3-Bi(Mg 0.5Ti 0.5)O 3 epitaxial films and their crystal structure and electrical property characterizations",

abstract = "Epitaxial (1-x)BaTiO 3-xBi(Mg 0.5Ti 0.5) O 3 films with x 0 - 0.9 were grown on (111)cSrRuO 3(111) SrTiO 3 substrates by pulsed laser deposition (PLD). Plotting the temperature where dielectric constant reaches a maximum {T[ε r(max.)]} versus Bi(Mg 0.5,Ti 0.5)O 3 content present minimum at x 0.1. On the other hand, the remanent polarization (Pr) and the effective transverse piezoelectric constant [d 33(eff.)] showed minimum at 0.1 and 0.2, respectively, but increased with the increase of x in (1-x)BaTiO 3-xBi(Mg 0.5Ti 0.5)O 3 above these values. These results show the simultaneous increase of T[ε r(max.)] and d 33(eff.) for the films above x 0.2 that normally showed treads off characteristics. {\textcopyright} 2012 American Institute of Physics.",

author = "Hidenori Tanaka and Mohamed-Tahar Chentir and Tomoaki Yamada and Shintaro Yasui and Yoshitaka Ehara and Keisuke Yamato and Yuta Kashiwagi and Chua, {Ngeah Theng} and Junling Wang and Soichiro Okamura and Hiroshi Uchida and Takashi Iijima and Satoshi Wada and Hiroshi Funakubo",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].",

year = "2012",

month = apr,

day = "15",

doi = "10.1063/1.4704384",

language = "English",

volume = "111",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

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Tanaka, H, Chentir, M-T, Yamada, T, Yasui, S, Ehara, Y, Yamato, K, Kashiwagi, Y, Chua, NT, Wang, J, Okamura, S, Uchida, H, Iijima, T, Wada, S & Funakubo, H 2012, 'Growth of (111)-oriented BaTiO ₃-Bi(Mg _0.5Ti _0.5)O ₃ epitaxial films and their crystal structure and electrical property characterizations', Journal of Applied Physics, vol. 111, no. 8, 084108. https://doi.org/10.1063/1.4704384

Growth of (111)-oriented BaTiO ₃-Bi(Mg _0.5Ti _0.5)O ₃ epitaxial films and their crystal structure and electrical property characterizations. / Tanaka, Hidenori; Chentir, Mohamed-Tahar; Yamada, Tomoaki et al.
In: Journal of Applied Physics, Vol. 111, No. 8, 084108, 15.04.2012.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

TY - JOUR

T1 - Growth of (111)-oriented BaTiO 3-Bi(Mg 0.5Ti 0.5)O 3 epitaxial films and their crystal structure and electrical property characterizations

AU - Tanaka, Hidenori

AU - Chentir, Mohamed-Tahar

AU - Yamada, Tomoaki

AU - Yasui, Shintaro

AU - Ehara, Yoshitaka

AU - Yamato, Keisuke

AU - Kashiwagi, Yuta

AU - Chua, Ngeah Theng

AU - Wang, Junling

AU - Okamura, Soichiro

AU - Uchida, Hiroshi

AU - Iijima, Takashi

AU - Wada, Satoshi

AU - Funakubo, Hiroshi

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2012/4/15

Y1 - 2012/4/15

N2 - Epitaxial (1-x)BaTiO 3-xBi(Mg 0.5Ti 0.5) O 3 films with x 0 - 0.9 were grown on (111)cSrRuO 3(111) SrTiO 3 substrates by pulsed laser deposition (PLD). Plotting the temperature where dielectric constant reaches a maximum {T[ε r(max.)]} versus Bi(Mg 0.5,Ti 0.5)O 3 content present minimum at x 0.1. On the other hand, the remanent polarization (Pr) and the effective transverse piezoelectric constant [d 33(eff.)] showed minimum at 0.1 and 0.2, respectively, but increased with the increase of x in (1-x)BaTiO 3-xBi(Mg 0.5Ti 0.5)O 3 above these values. These results show the simultaneous increase of T[ε r(max.)] and d 33(eff.) for the films above x 0.2 that normally showed treads off characteristics. © 2012 American Institute of Physics.

AB - Epitaxial (1-x)BaTiO 3-xBi(Mg 0.5Ti 0.5) O 3 films with x 0 - 0.9 were grown on (111)cSrRuO 3(111) SrTiO 3 substrates by pulsed laser deposition (PLD). Plotting the temperature where dielectric constant reaches a maximum {T[ε r(max.)]} versus Bi(Mg 0.5,Ti 0.5)O 3 content present minimum at x 0.1. On the other hand, the remanent polarization (Pr) and the effective transverse piezoelectric constant [d 33(eff.)] showed minimum at 0.1 and 0.2, respectively, but increased with the increase of x in (1-x)BaTiO 3-xBi(Mg 0.5Ti 0.5)O 3 above these values. These results show the simultaneous increase of T[ε r(max.)] and d 33(eff.) for the films above x 0.2 that normally showed treads off characteristics. © 2012 American Institute of Physics.

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DO - 10.1063/1.4704384

M3 - RGC 21 - Publication in refereed journal

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

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