Abstract
Reversible switching characteristics of organic nonvolatile memory transistors (ONVMTs) using chemically synthesized graphene oxide (GO) nanosheets as a charge-trapping layer are reported. The transfer curves of GO based ONVMTs showed large gate bias dependent hysteresis with threshold voltage shifts over 20 V. After writing and erasing, stored data were well maintained showing more than two orders of ON/OFF ratio (ION/IOFF = ∼102) for 104 s. These results suggest that GO nanosheets are one potential candidate as the charge-trapping layer in ONVMTs. © 2010 American Institute of Physics.
| Original language | English |
|---|---|
| Article number | 023310 |
| Journal | Applied Physics Letters |
| Volume | 97 |
| Issue number | 2 |
| Online published | 15 Jul 2010 |
| DOIs | |
| Publication status | Published - Jul 2010 |
| Externally published | Yes |
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