Grain rotation mechanisms in nanocrystalline materials : Multiscale observations in Pt thin films

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

2 Scopus Citations
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Author(s)

  • Yuan Tian
  • Xiaoguo Gong
  • Mingjie Xu
  • Yutong Bi
  • Leonardo Velasco Estrada
  • Evgeniy Boltynjuk
  • Horst Hahn
  • Xiaoqing Pan

Detail(s)

Original languageEnglish
Pages (from-to)49-54
Journal / PublicationScience
Volume386
Issue number6717
Online published3 Oct 2024
Publication statusPublished - 4 Oct 2024

Abstract

Near-rigid-body grain rotation is commonly observed during grain growth, recrystallization, and plastic deformation in nanocrystalline materials. Despite decades of research, the dominant mechanisms underlying grain rotation remain enigmatic. We present direct evidence that grain rotation occurs through the motion of disconnections (line defects with step and dislocation character) along grain boundaries in platinum thin films. State-of-the-art in situ four-dimensional scanning transmission electron microscopy (4D-STEM) observations reveal the statistical correlation between grain rotation and grain growth or shrinkage. This correlation arises from shear-coupled grain boundary migration, which occurs through the motion of disconnections, as demonstrated by in situ high-angle annular dark-field STEM observations and the atomistic simulation-aided analysis. These findings provide quantitative insights into the structural dynamics of nanocrystalline materials.

Citation Format(s)

Grain rotation mechanisms in nanocrystalline materials: Multiscale observations in Pt thin films. / Tian, Yuan; Gong, Xiaoguo; Xu, Mingjie et al.
In: Science, Vol. 386, No. 6717, 04.10.2024, p. 49-54.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review