TY - JOUR
T1 - Geometric moment in image watermarking
AU - Li, Zhang
AU - Kwong, Sam
AU - Wei, Gang
PY - 2003
Y1 - 2003
N2 - Digital image watermarking has become a popular technique for authentication and copyright protection. However, many proposed image watermarking techniques are sensitive to geometric distortions, such as rotation and scaling. Rotation and scaling, even by slight amount, can make the decoder disabled unless the corrupted image can be rescaled and rotated back to its original size and original orientation. So it is very important to estimate the rotation angle and scaling factor correctly before watermark detection. In our approach, we propose a new way to estimate the rotation angle and scaling factor after the watermarked image has been scaled or/and rotated by using geometric moments of original image. The experimental results show that our method has a good robustness to wide rotation angle and scaling factor ranges.
AB - Digital image watermarking has become a popular technique for authentication and copyright protection. However, many proposed image watermarking techniques are sensitive to geometric distortions, such as rotation and scaling. Rotation and scaling, even by slight amount, can make the decoder disabled unless the corrupted image can be rescaled and rotated back to its original size and original orientation. So it is very important to estimate the rotation angle and scaling factor correctly before watermark detection. In our approach, we propose a new way to estimate the rotation angle and scaling factor after the watermarked image has been scaled or/and rotated by using geometric moments of original image. The experimental results show that our method has a good robustness to wide rotation angle and scaling factor ranges.
UR - http://www.scopus.com/inward/record.url?scp=0038421765&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0038421765&origin=recordpage
U2 - 10.1109/ISCAS.2003.1206128
DO - 10.1109/ISCAS.2003.1206128
M3 - RGC 22 - Publication in policy or professional journal
SN - 0271-4310
VL - 2
JO - Proceedings - IEEE International Symposium on Circuits and Systems
JF - Proceedings - IEEE International Symposium on Circuits and Systems
T2 - Proceedings of the 2003 IEEE International Symposium on Circuits and Systems
Y2 - 25 May 2003 through 28 May 2003
ER -