Frequency limitation in the calibration of microwave test fixtures

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

13 Scopus Citations
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Author(s)

Related Research Unit(s)

Detail(s)

Original languageEnglish
Pages (from-to)2000-2006
Journal / PublicationIEEE Transactions on Microwave Theory and Techniques
Volume51
Issue number9
Publication statusPublished - Sep 2003

Abstract

The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. For asymmetric test fixtures, a new algorithm based on the thru-short-match (TSM) method is outlined. It is found that the conventional TSM method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. This limitation can be avoided by using a different algorithm. The various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. Several ways in avoiding the problem are proposed. There is good agreement between the theories and experimental data.

Research Area(s)

  • Calibration, Deembedding, Microwave network analyzer, Scattering parameter measurement, Test fixture

Citation Format(s)

Frequency limitation in the calibration of microwave test fixtures. / Zhu, Ning Hua; Qian, Chen; Wang, You Lin; Pun, Edwin Y.B.; Chung, Po-Shuen.

In: IEEE Transactions on Microwave Theory and Techniques, Vol. 51, No. 9, 09.2003, p. 2000-2006.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review