Focused-Ion-Beam-Deposited Pt Contacts on ZnO Nanowires

Jr-Hau He; Pei H. Chang; Cheng-Ying Chen; Kun-Tonh Tsai

doi:10.1149/1.3095822

Focused-Ion-Beam-Deposited Pt Contacts on ZnO Nanowires

Jr-Hau He
, Pei H. Chang
, Cheng-Ying Chen
, Kun-Tonh Tsai

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

4 Citations (Scopus)

Abstract

We report on the transport properties of single ZnO nanowires measured as a function of the length/square of radius ratio via transmission line method. The specific contact resistance of the FIB Pt contacts to the ZnO nanowires is determined as low as 1.1x10-5 Ωcm2. The resistivity of the ZnO nanowires is measured to be 2.2×10-2 Ωcm. ZnO nanowire-based UV photodetectors contacted by the FIB-Pt with the photoconductive gain as high as ∼108 have been fabricated and characterized.

Original language	English
Title of host publication	One-Dimensional Nanoscale Electronic and Photonic Devices 2 (ECS Transactions)
Editors	L.–J. Chou, C. Chang
Publisher	The Electrochemical Society
Pages	13-20
ISBN (Electronic)	9781566777087
ISBN (Print)	9781607680581, 9781615673070
DOIs	https://doi.org/10.1149/1.3095822
Publication status	Published - 2009
Externally published	Yes
Event	One-Dimensional Nanoscale Electronic and Photonic Devices 2 - 214th ECS Meeting - Honolulu, United States Duration: 12 Oct 2008 → 17 Oct 2008 https://www.electrochem.org/214 (For reference)

Publication series

Name	ECS Transactions
Publisher	The Electrochemical Society
Number	33
Volume	16
ISSN (Print)	1938-5862
ISSN (Electronic)	1938-6737

Conference

Conference	One-Dimensional Nanoscale Electronic and Photonic Devices 2 - 214th ECS Meeting
Place	United States
City	Honolulu
Period	12/10/08 → 17/10/08
Internet address	https://www.electrochem.org/214 (For reference)

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@inproceedings{203874129e8a4ba099bb04cf740ddaea,

title = "Focused-Ion-Beam-Deposited Pt Contacts on ZnO Nanowires",

abstract = "We report on the transport properties of single ZnO nanowires measured as a function of the length/square of radius ratio via transmission line method. The specific contact resistance of the FIB Pt contacts to the ZnO nanowires is determined as low as 1.1x10-5 Ωcm2. The resistivity of the ZnO nanowires is measured to be 2.2×10-2 Ωcm. ZnO nanowire-based UV photodetectors contacted by the FIB-Pt with the photoconductive gain as high as ∼108 have been fabricated and characterized.",

author = "Jr-Hau He and Chang, \{Pei H.\} and Cheng-Ying Chen and Kun-Tonh Tsai",

year = "2009",

doi = "10.1149/1.3095822",

language = "English",

isbn = "9781607680581",

series = "ECS Transactions",

publisher = "The Electrochemical Society",

number = "33",

pages = "13--20",

editor = "Chou, \{L.–J. \} and C. Chang",

booktitle = "One-Dimensional Nanoscale Electronic and Photonic Devices 2 (ECS Transactions)",

address = "United States",

note = "One-Dimensional Nanoscale Electronic and Photonic Devices 2 - 214th ECS Meeting ; Conference date: 12-10-2008 Through 17-10-2008",

url = "https://www.electrochem.org/214",

}

He, J-H, Chang, PH, Chen, C-Y & Tsai, K-T 2009, Focused-Ion-Beam-Deposited Pt Contacts on ZnO Nanowires. in LJ Chou & C Chang (eds), One-Dimensional Nanoscale Electronic and Photonic Devices 2 (ECS Transactions). ECS Transactions, no. 33, vol. 16, The Electrochemical Society, pp. 13-20, One-Dimensional Nanoscale Electronic and Photonic Devices 2 - 214th ECS Meeting, Honolulu, Hawaii, United States, 12/10/08. https://doi.org/10.1149/1.3095822

Focused-Ion-Beam-Deposited Pt Contacts on ZnO Nanowires. / He, Jr-Hau; Chang, Pei H.; Chen, Cheng-Ying et al.
One-Dimensional Nanoscale Electronic and Photonic Devices 2 (ECS Transactions). ed. / L.–J. Chou; C. Chang. The Electrochemical Society, 2009. p. 13-20 (ECS Transactions; Vol. 16, No. 33).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - Focused-Ion-Beam-Deposited Pt Contacts on ZnO Nanowires

AU - He, Jr-Hau

AU - Chang, Pei H.

AU - Chen, Cheng-Ying

AU - Tsai, Kun-Tonh

PY - 2009

Y1 - 2009

N2 - We report on the transport properties of single ZnO nanowires measured as a function of the length/square of radius ratio via transmission line method. The specific contact resistance of the FIB Pt contacts to the ZnO nanowires is determined as low as 1.1x10-5 Ωcm2. The resistivity of the ZnO nanowires is measured to be 2.2×10-2 Ωcm. ZnO nanowire-based UV photodetectors contacted by the FIB-Pt with the photoconductive gain as high as ∼108 have been fabricated and characterized.

AB - We report on the transport properties of single ZnO nanowires measured as a function of the length/square of radius ratio via transmission line method. The specific contact resistance of the FIB Pt contacts to the ZnO nanowires is determined as low as 1.1x10-5 Ωcm2. The resistivity of the ZnO nanowires is measured to be 2.2×10-2 Ωcm. ZnO nanowire-based UV photodetectors contacted by the FIB-Pt with the photoconductive gain as high as ∼108 have been fabricated and characterized.

UR - https://www.scopus.com/pages/publications/70449637711

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-70449637711&origin=recordpage

U2 - 10.1149/1.3095822

DO - 10.1149/1.3095822

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 9781607680581

SN - 9781615673070

T3 - ECS Transactions

SP - 13

EP - 20

BT - One-Dimensional Nanoscale Electronic and Photonic Devices 2 (ECS Transactions)

A2 - Chou, L.–J.

A2 - Chang, C.

PB - The Electrochemical Society

T2 - One-Dimensional Nanoscale Electronic and Photonic Devices 2 - 214th ECS Meeting

Y2 - 12 October 2008 through 17 October 2008

ER -

Focused-Ion-Beam-Deposited Pt Contacts on ZnO Nanowires

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