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First principles study of interfacial adhesion: The Mo/MoSi2 interface with and without impurities

T. Hong, J. R. Smith, D. J. Srolovitz

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

Adhesive properties of the Mo(001)//MoSi2(001) heterophase interface with and without C, O, B, S, and Nb impurities are calculated using a first principles local density functional approach. The adhesive energy and interfacial strength of the impurity-free interface are 10% to 15% smaller than the respective values for cleavage along the (001) planes of Mo and MoSi2. All of the impurities were found to decrease the Mo//MoSi2 adhesive energy. The substitutional impurities S and Nb decrease the interfacial strength, while the interstitial impurities C, O, and B increase it. All of the impurities increase the interfacial spacing in proportion to their covalent radii. The impurity effects on adhesion may be described in terms of competing bonding and strain effects.
Original languageEnglish
Title of host publicationSymposium R – Joining and Adhesion of Advanced Inorganic Materials
PublisherCambridge University Press
Pages3-14
Volume314
ISBN (Print)155899212
DOIs
Publication statusPublished - Apr 1993
Externally publishedYes
Event1993 MRS Spring Meeting - San Francisco, United States
Duration: 12 Apr 199316 Apr 1993
https://www.mrs.org/spring1993

Publication series

NameMaterials Research Society Symposium Proceedings
Volume314
ISSN (Electronic)0272-9172

Conference

Conference1993 MRS Spring Meeting
PlaceUnited States
CitySan Francisco
Period12/04/9316/04/93
Internet address

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