Abstract
Adhesive properties of the Mo(001)//MoSi2(001) heterophase interface with and without C, O, B, S, and Nb impurities are calculated using a first principles local density functional approach. The adhesive energy and interfacial strength of the impurity-free interface are 10% to 15% smaller than the respective values for cleavage along the (001) planes of Mo and MoSi2. All of the impurities were found to decrease the Mo//MoSi2 adhesive energy. The substitutional impurities S and Nb decrease the interfacial strength, while the interstitial impurities C, O, and B increase it. All of the impurities increase the interfacial spacing in proportion to their covalent radii. The impurity effects on adhesion may be described in terms of competing bonding and strain effects.
| Original language | English |
|---|---|
| Title of host publication | Symposium R – Joining and Adhesion of Advanced Inorganic Materials |
| Publisher | Cambridge University Press |
| Pages | 3-14 |
| Volume | 314 |
| ISBN (Print) | 155899212 |
| DOIs | |
| Publication status | Published - Apr 1993 |
| Externally published | Yes |
| Event | 1993 MRS Spring Meeting - San Francisco, United States Duration: 12 Apr 1993 → 16 Apr 1993 https://www.mrs.org/spring1993 |
Publication series
| Name | Materials Research Society Symposium Proceedings |
|---|---|
| Volume | 314 |
| ISSN (Electronic) | 0272-9172 |
Conference
| Conference | 1993 MRS Spring Meeting |
|---|---|
| Place | United States |
| City | San Francisco |
| Period | 12/04/93 → 16/04/93 |
| Internet address |
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