Fingerprint classification based on extraction and analysis of singularities and pseudo ridges

Qinzhi Zhang; Hong Yan

doi:10.1016/j.patcog.2003.12.020

Author(s)

Qinzhi Zhang
Hong Yan

Related Research Unit(s)

Department of Electrical Engineering

Detail(s)

Original language	English
Pages (from-to)	2233-2243
Journal / Publication	Pattern Recognition
Volume	37
Issue number	11
Publication status	Published - Nov 2004

Link(s)

DOI	DOI https://doi.org/10.1016/j.patcog.2003.12.020 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-12344322746&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(cc626459-954f-41e1-99f1-1d5242e2568e).html

Abstract

In this paper, we introduce a new approach to fingerprint classification based on extraction and analysis of both singularities and traced pseudo ridges relating to singular points. Because of the image quality, it is difficult to get the correct number and position of the singularities that are widely used in current structural classification methods. With the help of pseudo ridge tracing and analysis of the traced curves, our method does not rely on the extraction of the exact number and positions of the true singular point(s), thus improving the classification accuracy. This method has been tested on the NIST special fingerprint database 4. For the 4000 images in this database, the classification accuracy reaches 92.7% for the 4-class problem. © 2004 Pattern Recognition Society. Published by Elsevier Ltd. All rights reserved.