Fidelity susceptibility in the two-dimensional transverse-field Ising and XXZ models

W.C. Yu*, Ho Man Kwok, Junpeng Cao, Shi Jian Gu

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

41 Citations (Scopus)

Abstract

We study the fidelity susceptibility in the two-dimensional (2D) transverse-field Ising model and the 2D XXZ model numerically. It is found that in both models, the fidelity susceptibility as a function of the driving parameter diverges at the critical points. The validity of the fidelity susceptibility to signal for the quantum phase transition is thus verified in these two models. We also compare the scaling behavior of the extremum of the fidelity susceptibility to that of the second derivative of the ground-state energy. From those results, the theoretical argument that fidelity susceptibility is a more sensitive seeker for a second-order quantum phase transition is also testified in the two models.
Original languageEnglish
Article number021108
JournalPhysical Review E - Statistical, Nonlinear, and Soft Matter Physics
Volume80
Issue number2
Online published13 Aug 2009
DOIs
Publication statusPublished - Aug 2009
Externally publishedYes

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