Fermi-surface transformation across the pseudogap critical point of the cuprate superconductor La1.6-xNd0.4SrxCuO4

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • C. Collignon
  • S. Badoux
  • S. A.A. Afshar
  • F. Laliberté
  • O. Cyr-Choinière
  • J. S. Zhou
  • S. Licciardello
  • S. Wiedmann
  • N. Doiron-Leyraud
  • Louis Taillefer

Detail(s)

Original languageEnglish
Article number224517
Journal / PublicationPhysical Review B
Volume95
Issue number22
Publication statusPublished - 29 Jun 2017
Externally publishedYes

Abstract

The electrical resistivity ρ and Hall coefficient RH of the tetragonal single-layer cuprate La1.6-xNd0.4SrxCuO4 were measured in magnetic fields up to H=37.5 T, large enough to access the normal state at T→0, for closely spaced dopings p across the pseudogap critical point at p=0.23. Below p, both coefficients exhibit an upturn at low temperature, which gets more pronounced with decreasing p. Taken together, these upturns show that the normal-state carrier density n at T=0 drops upon entering the pseudogap phase. Quantitatively, it goes from n=1+p at p=0.24 to n=p at p=0.20. By contrast, the mobility does not change appreciably, as revealed by the magnetoresistance. Our data are in excellent agreement with recent high-field data on YBa2Cu3Oy and La2-xSrxCuO4. The quantitative consistency across three different cuprates shows that a drop in carrier density from 1+p to p is a universal signature of the pseudogap transition at T=0. We discuss the implication of these findings for the nature of the pseudogap phase.

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Citation Format(s)

Fermi-surface transformation across the pseudogap critical point of the cuprate superconductor La1.6-xNd0.4SrxCuO4. / Collignon, C.; Badoux, S.; Afshar, S. A.A.; Michon, B.; Laliberté, F.; Cyr-Choinière, O.; Zhou, J. S.; Licciardello, S.; Wiedmann, S.; Doiron-Leyraud, N.; Taillefer, Louis.

In: Physical Review B, Vol. 95, No. 22, 224517, 29.06.2017.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review